Freescale Semiconductor Document Number: MRF1511N Technical Data Rev. 8, 6/2009 RF Power Field Effect Transistor N-Channel Enhancement-Mode Lateral MOSFET MRF1511NT1 Designed for broadband commercial and industrial applications at frequen- cies to 175 MHz. The high gain and broadband performance of this device makes it ideal for large-signal, common source amplifier applications in 7.5 volt portable FM equipment. • Specified Performance @ 175 MHz, 7.5 Volts D Output Power (cid:151) 8 Watts Power Gain (cid:151) 13 dB 175 MHz, 8 W, 7.5 V Efficiency (cid:151) 70% LATERAL N-CHANNEL • Capable of Handling 20:1 VSWR, @ 9.5 Vdc, BROADBAND 175 MHz, 2 dB Overdrive RF POWER MOSFET Features • Excellent Thermal Stability G • Characterized with Series Equivalent Large-Signal Impedance Parameters • N Suffix Indicates Lead-Free Terminations. RoHS Compliant. • In Tape and Reel. T1 Suffix = 1,000 Units per 12 mm, S 7 inch Reel. CASE 466-03, STYLE 1 PLD-1.5 PLASTIC Table 1. Maximum Ratings Rating Symbol Value Unit Drain-Source Voltage VDSS -0.5, +40 Vdc Gate-Source Voltage VGS ±20 Vdc Drain Current (cid:151) Continuous ID 4 Adc Total Device Dissipation @ TC = 25°C (1) PD 62.5 W Derate above 25°C 0.5 W/°C Storage Temperature Range Tstg -65 to +150 °C Operating Junction Temperature TJ 150 °C Table 2. Thermal Characteristics Characteristic Symbol Value (2) Unit Thermal Resistance, Junction to Case RθJC 2 °C/W Table 3. Moisture Sensitivity Level Test Methodology Rating Package Peak Temperature Unit Per JESD22-A113, IPC/JEDEC J-STD-020 3 260 °C TJ(cid:150)TC 1. Calculated based on the formula PD = RθJC 2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and packaging MOS devices should be observed. © Freescale Semiconductor, Inc., 2008-2009. All rights reserved. MRF1511NT1 RF Device Data Freescale Semiconductor 1

Table 4. Electrical Characteristics (TA = 25°C unless otherwise noted) Characteristic Symbol Min Typ Max Unit Off Characteristics Zero Gate Voltage Drain Current IDSS (cid:151) (cid:151) 1 μAdc (VDS = 35 Vdc, VGS = 0) Gate-Source Leakage Current IGSS (cid:151) (cid:151) 1 μAdc (VGS = 10 Vdc, VDS = 0) On Characteristics Gate Threshold Voltage VGS(th) 1 1.6 2.1 Vdc (VDS = 7.5 Vdc, ID = 170 μA) Drain-Source On-Voltage VDS(on) (cid:151) 0.4 (cid:151) Vdc (VGS = 10 Vdc, ID = 1 Adc) Dynamic Characteristics Input Capacitance Ciss (cid:151) 100 (cid:151) pF (VDS = 7.5 Vdc, VGS = 0, f = 1 MHz) Output Capacitance Coss (cid:151) 53 (cid:151) pF (VDS = 7.5 Vdc, VGS = 0, f = 1 MHz) Reverse Transfer Capacitance Crss (cid:151) 8 (cid:151) pF (VDS = 7.5 Vdc, VGS = 0, f = 1 MHz) Functional Tests (In Freescale Test Fixture) Common-Source Amplifier Power Gain Gps (cid:151) 13 (cid:151) dB (VDD = 7.5 Vdc, Pout = 8 Watts, IDQ = 150 mA, f = 175 MHz) Drain Efficiency η (cid:151) 70 (cid:151) % (VDD = 7.5 Vdc, Pout = 8 Watts, IDQ = 150 mA, f = 175 MHz) MRF1511NT1 RF Device Data 2 Freescale Semiconductor

VGG + VDD + B1 C18 B2 C17 C16 C15 C8 C7 C6 R4 R3 L4 C5 R2 N2 Z6 Z7 Z8 L3 Z9 Z10 R1 N1 Z1 L1 Z2 L2 Z3 Z4 Z5 DUT C14 RF OUTPUT C9 C10 C11 C12 C13 RF C1 C2 C3 INPUT C4 B1, B2 Short Ferrite Beads, Fair Rite Products R1 15 Ω, 0805 Chip Resistor (2743021446) R2 1.0 kΩ, 1/8 W Resistor C1, C5, C18 120 pF, 100 mil Chip Capacitors R3 1.0 kΩ, 0805 Chip Resistor C2, C10, C12 0 to 20 pF, Trimmer Capacitors R4 33 kΩ, 1/8 W Resistor C3 33 pF, 100 mil Chip Capacitor Z1 0.200″ x 0.080″ Microstrip C4 68 pF, 100 mil Chip Capacitor Z2 0.755″ x 0.080″ Microstrip C6, C15 10 μF, 50 V Electrolytic Capacitors Z3 0.300″ x 0.080″ Microstrip C7, C16 1,200 pF, 100 mil Chip Capacitors Z4 0.065″ x 0.080″ Microstrip C8, C17 0.1 μF, 100 mil Chip Capacitors Z5, Z6 0.260″ x 0.223″ Microstrip C9 150 pF, 100 mil Chip Capacitor Z7 0.095″ x 0.080″ Microstrip C11 43 pF, 100 mil Chip Capacitor Z8 0.418″ x 0.080″ Microstrip C13 24 pF, 100 mil Chip Capacitor Z9 1.057″ x 0.080″ Microstrip C14 300 pF, 100 mil Chip Capacitor Z10 0.120″ x 0.080″ Microstrip ® L1, L3 12.5 nH, A04T, Coilcraft Board Glass Teflon , 31 mils, 2 oz. Copper L2 26 nH, 4 Turn, Coilcraft L4 55.5 nH, 5 Turn, Coilcraft N1, N2 Type N Flange Mounts Figure 1. 135 - 175 MHz Broadband Test Circuit TYPICAL CHARACTERISTICS, 135 - 175 MHz 10 −5 VDD = 7.5 V WATTS) 8 155 MHz SS (dB) −10 OWER ( 6 175 MHz 135 MHz URN LO 113755 MMHHzz P T −15 T E TPU 4 UT R 155 MHz U P O N , Pout 2 IRL, I −20 VDD = 7.5 V 0 −25 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 1 2 3 4 5 6 7 8 9 10 Pin, INPUT POWER (WATTS) Pout, OUTPUT POWER (WATTS) Figure 2. Output Power versus Input Power Figure 3. Input Return Loss versus Output Power MRF1511NT1 RF Device Data Freescale Semiconductor 3

TYPICAL CHARACTERISTICS, 135 - 175 MHz 16 70 155 MHz 155 MHz 60 135 MHz 14 %) 135 MHz Y ( 50 175 MHz C 175 MHz N N (dB) 12 FFICIE 40 GAI 10 N E 30 AI R D 20 8 Eff, 10 VDD = 7.5 V VDD = 7.5 V 6 0 1 2 3 4 5 6 7 8 9 10 0 1 2 3 4 5 6 7 8 9 10 Pout, OUTPUT POWER (WATTS) Pout, OUTPUT POWER (WATTS) Figure 4. Gain versus Output Power Figure 5. Drain Efficiency versus Output Power 12 80 11 S) TT %) WA 10 Y ( 70 R ( NC 155 MHz E 9 155 MHz E W CI T PO 8 135 MHz EFFI 60 135 MHz U 175 MHz N TP 7 AI U R 175 MHz O D , ut 6 Eff, 50 Po 5 VDD = 7.5 V VDD = 7.5 V Pin = 27 dBm Pin = 27 dBm 4 40 0 200 400 600 800 1000 0 200 400 600 800 1000 IDQ, BIASING CURRENT (mA) IDQ, BIASING CURRENT (mA) Figure 6. Output Power versus Biasing Current Figure 7. Drain Efficiency versus Biasing Current 14 80 S) 12 TT %) 70 WA Y ( R ( 10 175 MHz 135 MHz NC 155 MHz WE CIE 60 T PO 8 155 MHz EFFI 117355 MMHHzz U N TP AI 50 OU 6 DR , ut Eff, Po 4 IDQ = 150 mA 40 Pin = 27 dBm IDQ = 150 mA Pin = 27 dBm 2 30 4 6 8 10 12 14 16 4 6 8 10 12 14 16 VDD, SUPPLY VOLTAGE (VOLTS) VDD, SUPPLY VOLTAGE (VOLTS) Figure 8. Output Power versus Supply Voltage Figure 9. Drain Efficiency versus Supply Voltage MRF1511NT1 RF Device Data 4 Freescale Semiconductor

VGG + VDD + B1 C16 B2 C15 C14 C13 C8 C7 C6 R4 R3 L4 C5 R2 N2 Z6 Z7 Z8 L3 Z9 Z10 RF R1 N1 DUT C12 OUTPUT Z1 L1 Z2 Z3 Z4 Z5 RF INPUT C9 C10 C11 C1 C2 C3 C4 B1, B2 Short Ferrite Beads, Fair Rite Products N1, N2 Type N Flange Mounts (2743021446) R1 15 Ω, 0805 Chip Resistor C1, C12 330 pF, 100 mil Chip Capacitors R2 51 Ω, 1/2 W Resistor C2 43 pF, 100 mil Chip Capacitor R3 100 Ω, 0805 Chip Resistor C3, C10 0 to 20 pF, Trimmer Capacitors R4 33 kΩ, 1/8 W Resistor C4 24 pF, 100 mil Chip Capacitor Z1 0.136″ x 0.080″ Microstrip C5, C16 120 pF, 100 mil Chip Capacitors Z2 0.242″ x 0.080″ Microstrip C6, C13 10 μF, 50 V Electrolytic Capacitors Z3 1.032″ x 0.080″ Microstrip C7, C14 1,200 pF, 100 mil Chip Capacitors Z4 0.145″ x 0.080″ Microstrip C8, C15 0.1 μF, 100 mil Chip Capacitors Z5, Z6 0.260″ x 0.223″ Microstrip C9 380 pF, 100 mil Chip Capacitor Z7 0.134″ x 0.080″ Microstrip C11 75 pF, 100 mil Chip Capacitor Z8 0.490″ x 0.080″ Microstrip L1 82 nH, Coilcraft Z9 0.872″ x 0.080″ Microstrip L2 55.5 nH, 5 Turn, Coilcraft Z10 0.206″ x 0.080″ Microstrip ® L3 39 nH, 6 Turn, Coilcraft Board Glass Teflon , 31 mils, 2 oz. Copper Figure 10. 66 - 88 MHz Broadband Test Circuit TYPICAL CHARACTERISTICS, 66 - 88 MHz 10 0 77 MHz −2 VDD = 7.5 V WATTS) 8 88 MHz 66 MHz SS (dB) −−64 WER ( 6 RN LO −8 PO TU−10 88 MHz T E PU 4 T R−12 T U OU NP−14 , Pout 2 IRL, I−16 66 MHz VDD = 7.5 V −18 77 MHz 0 −20 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 1 2 3 4 5 6 7 8 9 10 Pin, INPUT POWER (WATTS) Pout, OUTPUT POWER (WATTS) Figure 11. Output Power versus Input Power Figure 12. Input Return Loss versus Output Power MRF1511NT1 RF Device Data Freescale Semiconductor 5

TYPICAL CHARACTERISTICS, 66 - 88 MHz 18 70 66 MHz 60 88 MHz 16 77 MHz %) Y ( 50 C 66 MHz N (dB) 14 88 MHz FFICIEN 40 77 MHz GAI 12 N E 30 AI R D 20 10 Eff, 10 VDD = 7.5 V VDD = 7.5 V 8 0 1 2 3 4 5 6 7 8 9 10 1 2 3 4 5 6 7 8 9 10 Pout, OUTPUT POWER (WATTS) Pout, OUTPUT POWER (WATTS) Figure 13. Gain versus Output Power Figure 14. Drain Efficiency versus Output Power 12 80 11 S) WATT 10 77 MHz Y (%) 70 R ( NC E 9 88 MHz E W CI T PO 8 66 MHz EFFI 60 88 MHz U N TP 7 AI OU DR 77 MHz , ut 6 Eff, 50 66 MHz Po VDD = 7.5 V VDD = 7.5 V 5 Pin = 25.7 dBm Pin = 25.7 dBm 4 40 0 200 400 600 800 1000 0 200 400 600 800 1000 IDQ, BIASING CURRENT (mA) IDQ, BIASING CURRENT (mA) Figure 15. Output Power versus Figure 16. Drain Efficiency versus Biasing Current Biasing Current 14 80 TS) 12 %) 70 AT Y ( POWER (W 180 66 MHz 77 MHz EFFICIENC 60 88 MHz PUT 88 MHz AIN 50 77 MHz UT 6 DR 66 MHz , OPout 4 IDQ = 150 mA Eff, 40 Pin = 25.7 dBm IDQ = 150 mA Pin = 25.7 dBm 2 30 5 6 7 8 9 10 5 6 7 8 9 10 VDD, SUPPLY VOLTAGE (VOLTS) VDD, SUPPLY VOLTAGE (VOLTS) Figure 17. Output Power versus Figure 18. Drain Efficiency versus Supply Voltage Supply Voltage MRF1511NT1 RF Device Data 6 Freescale Semiconductor

TYPICAL CHARACTERISTICS 109 2S) P M A X S R U HO 108 R ( O T C A F F T T M 107 90 100 110 120 130 140 150 160 170 180 190 200 210 TJ, JUNCTION TEMPERATURE (°C) This above graph displays calculated MTTF in hours x ampere2 drain current. Life tests at elevated temperatures have correlated to better than ±10% of the theoretical prediction for metal failure. Divide MTTF factor by ID2 for MTTF in a particular application. Figure 19. MTTF Factor versus Junction Temperature MRF1511NT1 RF Device Data Freescale Semiconductor 7

f = 175 MHz Zin Zin Zo = 10 Ω 155 f = 88 MHz 77 66 f = 88 MHz 77 135 ZOL* 66 155 f = 175 MHz ZOL* 135 VDD = 7.5 V, IDQ = 150 mA, Pout = 8 W VDD = 7.5 V, IDQ = 150 mA, Pout = 8 W f Zin ZOL* f Zin ZOL* MHz Ω Ω MHz Ω Ω 135 20.1 -j0.5 2.53 -j2.61 66 25.3 -j0.31 3.62 -j0.751 155 17.0 +j3.6 3.01 -j2.48 77 25.6 +j3.62 3.59 -j0.129 175 15.2 +j7.9 2.52 -j3.02 88 26.7 +j6.79 3.37 -j0.173 Zin = Complex conjugate of source Zin = Complex conjugate of source impedance with parallel 15 Ω impedance with parallel 15 Ω resistor and 68 pF capacitor in resistor and 24 pF capacitor in series with gate. (See Figure 1). series with gate. (See Figure 10). ZOL* = Complex conjugate of the load ZOL* = Complex conjugate of the load impedance at given output power, impedance at given output power, voltage, frequency, and ηD > 50 %. voltage, frequency, and ηD > 50 %. Note: ZOL* was chosen based on tradeoffs between gain, drain efficiency, and device stability. Input Device Output Matching Under Test Matching Network Network Z Z * in OL Figure 20. Series Equivalent Input and Output Impedance MRF1511NT1 RF Device Data 8 Freescale Semiconductor

Table 5. Common Source Scattering Parameters (V = 7.5 Vdc) DD I = 150 mA DQ S11 S21 S12 S22 ff MHz |S11| ∠φ |S21| ∠φ |S12| ∠φ |S22| ∠φ 30 0.88 -165 18.92 95 0.015 8 0.84 -169 50 0.88 -171 11.47 91 0.016 -5 0.84 -173 100 0.87 -175 5.66 85 0.016 -7 0.84 -176 150 0.87 -176 3.75 82 0.015 -5 0.85 -176 200 0.87 -177 2.78 78 0.014 -6 0.84 -176 250 0.87 -177 2.16 75 0.014 -10 0.85 -176 300 0.88 -177 1.77 72 0.012 -17 0.86 -176 350 0.88 -177 1.49 69 0.013 -11 0.86 -176 400 0.88 -177 1.26 66 0.013 -17 0.87 -175 450 0.88 -177 1.08 64 0.011 -20 0.87 -175 500 0.89 -176 0.96 63 0.012 -20 0.88 -175 I = 800 mA DQ S11 S21 S12 S22 ff MHz |S11| ∠φ |S21| ∠φ |S12| ∠φ |S22| ∠φ 30 0.89 -166 18.89 95 0.014 10 0.85 -170 50 0.88 -172 11.44 91 0.015 8 0.84 -174 100 0.87 -175 5.65 86 0.016 -2 0.85 -176 150 0.87 -177 3.74 82 0.014 -8 0.84 -177 200 0.87 -177 2.78 78 0.013 -18 0.85 -177 250 0.88 -177 2.16 75 0.012 -11 0.85 -176 300 0.88 -177 1.77 73 0.015 -15 0.86 -176 350 0.88 -177 1.50 70 0.009 -7 0.87 -176 400 0.88 -177 1.26 67 0.012 -3 0.87 -176 450 0.88 -177 1.09 65 0.012 -18 0.87 -175 500 0.89 -177 0.97 64 0.009 -10 0.88 -175 I = 1.5 A DQ S11 S21 S12 S22 ff MHz |S11| ∠φ |S21| ∠φ |S12| ∠φ |S22| ∠φ 30 0.90 -168 17.89 95 0.013 2 0.86 -172 50 0.89 -173 10.76 91 0.013 3 0.86 -175 100 0.88 -176 5.32 86 0.014 -19 0.86 -177 150 0.88 -177 3.53 83 0.013 -6 0.86 -177 200 0.88 -177 2.63 80 0.011 -4 0.86 -177 250 0.88 -178 2.05 77 0.012 -14 0.86 -177 300 0.88 -177 1.69 75 0.013 -2 0.87 -177 350 0.89 -177 1.43 72 0.010 -9 0.87 -176 400 0.89 -177 1.22 70 0.014 -3 0.88 -176 450 0.89 -177 1.06 68 0.011 -8 0.88 -176 500 0.89 -177 0.94 67 0.011 -15 0.88 -176 MRF1511NT1 RF Device Data Freescale Semiconductor 9

APPLICATIONS INFORMATION DESIGN CONSIDERATIONS This device is a common-source, RF power, N-Channel drain-source voltage under these conditions is termed enhancement mode, Lateral Metal-Oxide Semiconductor V . For MOSFETs, V has a positive temperature DS(on) DS(on) Field-Effect Transistor (MOSFET). Freescale Application coefficient at high temperatures because it contributes to the Note AN211A, (cid:147)FETs in Theory and Practice(cid:148), is suggested power dissipation within the device. reading for those not familiar with the construction and char- BV values for this device are higher than normally re- DSS acteristics of FETs. quired for typical applications. Measurement of BV is not DSS This surface mount packaged device was designed pri- recommended and may result in possible damage to the de- marily for VHF and UHF portable power amplifier applica- vice. tions. Manufacturability is improved by utilizing the tape and GATE CHARACTERISTICS reel capability for fully automated pick and placement of The gate of the RF MOSFET is a polysilicon material, and parts. However, care should be taken in the design process is electrically isolated from the source by a layer of oxide. to insure proper heat sinking of the device. The DC input resistance is very high - on the order of 109 Ω The major advantages of Lateral RF power MOSFETs in- (cid:151) resulting in a leakage current of a few nanoamperes. clude high gain, simple bias systems, relative immunity from Gate control is achieved by applying a positive voltage to thermal runaway, and the ability to withstand severely mis- the gate greater than the gate-to-source threshold voltage, matched loads without suffering damage. V . GS(th) MOSFET CAPACITANCES Gate Voltage Rating (cid:151) Never exceed the gate voltage The physical structure of a MOSFET results in capacitors rating. Exceeding the rated VGS can result in permanent between all three terminals. The metal oxide gate structure damage to the oxide layer in the gate region. determines the capacitors from gate-to-drain (C ), and Gate Termination (cid:151) The gates of these devices are es- gd gate-to-source (C ). The PN junction formed during fab- sentially capacitors. Circuits that leave the gate open-cir- gs rication of the RF MOSFET results in a junction capacitance cuited or floating should be avoided. These conditions can from drain-to-source (C ). These capacitances are charac- result in turn-on of the devices due to voltage build-up on ds terized as input (C ), output (C ) and reverse transfer the input capacitor due to leakage currents or pickup. iss oss (Crss) capacitances on data sheets. The relationships be- Gate Protection (cid:151) These devices do not have an internal tween the inter-terminal capacitances and those given on monolithic zener diode from gate-to-source. If gate protec- data sheets are shown below. The C can be specified in tion is required, an external zener diode is recommended. iss two ways: Using a resistor to keep the gate-to-source impedance low also helps dampen transients and serves another important 1. Drain shorted to source and positive voltage at the gate. function. Voltage transients on the drain can be coupled to 2. Positive voltage of the drain in respect to source and zero the gate through the parasitic gate-drain capacitance. If the volts at the gate. gate-to-source impedance and the rate of voltage change In the latter case, the numbers are lower. However, neither on the drain are both high, then the signal coupled to the gate method represents the actual operating conditions in RF ap- may be large enough to exceed the gate-threshold voltage plications. and turn the device on. DC BIAS Since this device is an enhancement mode FET, drain cur- Drain rent flows only when the gate is at a higher potential than the source. RF power FETs operate optimally with a quiescent Cgd drain current (I ), whose value is application dependent. DQ This device was characterized at I = 150 mA, which is the Gate Ciss = Cgd + Cgs DQ suggested value of bias current for typical applications. For Cds Coss = Cgd + Cds Crss = Cgd special applications such as linear amplification, IDQ may have to be selected to optimize the critical parameters. Cgs The gate is a dc open circuit and draws no current. There- fore, the gate bias circuit may generally be just a simple re- Source sistive divider network. Some special applications may require a more elaborate bias system. GAIN CONTROL DRAIN CHARACTERISTICS Power output of this device may be controlled to some de- One critical figure of merit for a FET is its static resistance gree with a low power dc control signal applied to the gate, in the full-on condition. This on-resistance, R , occurs thus facilitating applications such as manual gain control, DS(on) in the linear region of the output characteristic and is speci- ALC/AGC and modulation systems. This characteristic is fied at a specific gate-source voltage and drain current. The very dependent on frequency and load line. MRF1511NT1 RF Device Data 10 Freescale Semiconductor

MOUNTING The specified maximum thermal resistance of 2°C/W as- Large-signal impedances are provided, and will yield a good sumes a majority of the 0.065″ x 0.180″ source contact on first pass approximation. the back side of the package is in good contact with an ap- Since RF power MOSFETs are triode devices, they are not propriate heat sink. As with all RF power devices, the goal of unilateral. This coupled with the very high gain of this device the thermal design should be to minimize the temperature at yields a device capable of self oscillation. Stability may be the back side of the package. Refer to Freescale Application achieved by techniques such as drain loading, input shunt Note AN4005/D, (cid:147)Thermal Management and Mounting Meth- resistive loading, or output to input feedback. The RF test fix- od for the PLD-1.5 RF Power Surface Mount Package,(cid:148) and ture implements a parallel resistor and capacitor in series Engineering Bulletin EB209/D, (cid:147)Mounting Method for RF with the gate, and has a load line selected for a higher effi- Power Leadless Surface Mount Transistor(cid:148) for additional in- ciency, lower gain, and more stable operating region. formation. Two-port stability analysis with this device(cid:146)s AMPLIFIER DESIGN S-parameters provides a useful tool for selection of loading Impedance matching networks similar to those used with or feedback circuitry to assure stable operation. See Free- bipolar transistors are suitable for this device. For examples scale Application Note AN215A, (cid:147)RF Small-Signal Design see Freescale Application Note AN721, (cid:147)Impedance Using Two-Port Parameters(cid:148) for a discussion of two port Matching Networks Applied to RF Power Transistors.(cid:148) network theory and stability. MRF1511NT1 RF Device Data Freescale Semiconductor 11

PACKAGE DIMENSIONS 0.146 A 3.71 F 0.095 2.41 3 0.115 2.92 B D 1 2 R L 0.115 2.92 0.020 0.51 4 N 0.35 (0.89) X 45(cid:2) (cid:2) 5(cid:2) inches K 10(cid:2) DRAFT mm SOLDER FOOTPRINT Q U P INCHES MILLIMETERS H DIM MIN MAX MIN MAX ZONE V ÉÉÉÉ4ÉÉÉÉ C Y Y E AB 00..225255 00..226355 65..4782 65..7937 C 0.065 0.072 1.65 1.83 ÉÉÉÉÉÉÉÉ NOTES: DE 00..103201 00..105206 30..3503 30..8616 ZONE W 1ÉÉÉÉÉÉÉÉ2 12.. IPCNEOTRNE TRARSPOMRLEELT YI ND1G4IM. 5DEMINM, SE1I9NO8SN4IS.O NA:N IDN CTHOLERANCES GF 00..002560 00..004740 01..6267 11..1728 ÉÉÉÉÉÉÉÉ 3. RANESDI NX .BLEED/FLASH ALLOWABLE IN ZONE V, W, HJ 00..014650 00..016830 14..1046 14..6507 K 0.273 0.285 6.93 7.24 ÉÉÉÉÉÉÉÉ STYLE 1: L 0.245 0.255 6.22 6.48 PIN 1.DRAIN N 0.230 0.240 5.84 6.10 3 2.GATE P 0.000 0.008 0.00 0.20 G S 34..SSOOUURRCCEE QR 00..025050 00..026130 15..4008 15..6303 ZONE X S 0.006 0.012 0.15 0.31 U 0.006 0.012 0.15 0.31 VIEW Y-Y CASE 466-03 ZONE V 0.000 0.021 0.00 0.53 ISSUE D ZONE W 0.000 0.010 0.00 0.25 ZONE X 0.000 0.010 0.00 0.25 PLD-1.5 PLASTIC MRF1511NT1 RF Device Data 12 Freescale Semiconductor

PRODUCT DOCUMENTATION, TOOLS AND SOFTWARE Refer to the following documents to aid your design process. Application Notes • AN211A: Field Effect Transistors in Theory and Practice • AN215A: RF Small-Signal Design Using Two-Port Parameters • AN721: Impedance Matching Networks Applied to RF Power Transistors • AN4005: Thermal Management and Mounting Method for the PLD 1.5 RF Power Surface Mount Package Engineering Bulletins • EB212: Using Data Sheet Impedances for RF LDMOS Devices Software • Electromigration MTTF Calculator For Software and Tools, do a Part Number search at http://www.freescale.com, and select the (cid:147)Part Number(cid:148) link. Go to the Software & Tools tab on the part(cid:146)s Product Summary page to download the respective tool. REVISION HISTORY The following table summarizes revisions to this document. Revision Date Description 7 June 2008 • Corrected specified performance values for power gain and efficiency on p. 1 to match typical performance values in the functional test table on p. 2 • Added Product Documentation and Revision History, p. 13 8 June 2009 • Modified data sheet to reflect MSL rating change from 1 to 3 as a result of the standardization of packing process as described in Product and Process Change Notification number, PCN13516, p. 1 • Added Electromigration MTTF Calculator availability to Product Documentation, Tools and Software, p. 13 MRF1511NT1 RF Device Data Freescale Semiconductor 13

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