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  • 型号: BUZ32 H
  • 制造商: Infineon
  • 库位|库存: xxxx|xxxx
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BUZ32 H产品简介:

ICGOO电子元器件商城为您提供BUZ32 H由Infineon设计生产,在icgoo商城现货销售,并且可以通过原厂、代理商等渠道进行代购。 BUZ32 H价格参考。InfineonBUZ32 H封装/规格:晶体管 - FET,MOSFET - 单, 通孔 N 沟道 200V 9.5A(Tc) 75W(Tc) PG-TO220-3。您可以下载BUZ32 H参考资料、Datasheet数据手册功能说明书,资料中有BUZ32 H 详细功能的应用电路图电压和使用方法及教程。

产品参数 图文手册 常见问题
参数 数值
产品目录

分立半导体产品

描述

MOSFET N-CH 200V 9.5A TO220-3MOSFET N-Channel 200V Transistor

产品分类

FET - 单分离式半导体

FET功能

标准

FET类型

MOSFET N 通道,金属氧化物

Id-ContinuousDrainCurrent

9.5 A

Id-连续漏极电流

9.5 A

品牌

Infineon Technologies

产品手册

点击此处下载产品Datasheet

产品图片

rohs

符合RoHS无铅 / 符合限制有害物质指令(RoHS)规范要求

产品系列

晶体管,MOSFET,Infineon Technologies BUZ32 HSIPMOS®

数据手册

http://www.infineon.com/dgdl/Buz32H_Rev+2.4.pdf?folderId=db3a304325305e6d012596c6ca7b290a&fileId=db3a304325305e6d012597161028291a

产品型号

BUZ32 H

PCN过时产品

点击此处下载产品Datasheet

Pd-PowerDissipation

75 W

Pd-功率耗散

75 W

RdsOn-Drain-SourceResistance

400 mOhms

RdsOn-漏源导通电阻

400 mOhms

Vds-Drain-SourceBreakdownVoltage

200 V

Vds-漏源极击穿电压

200 V

Vgs-Gate-SourceBreakdownVoltage

+/- 20 V

Vgs-栅源极击穿电压

20 V

上升时间

40 nS

下降时间

30 nS

不同Id时的Vgs(th)(最大值)

4V @ 1mA

不同Vds时的输入电容(Ciss)

530pF @ 25V

不同Vgs时的栅极电荷(Qg)

-

不同 Id、Vgs时的 RdsOn(最大值)

400 毫欧 @ 6A,10V

产品种类

MOSFET

供应商器件封装

PG-TO220-3

其它名称

BUZ32H
BUZ32HXKSA1
SP000682998

典型关闭延迟时间

55 nS

功率-最大值

75W

包装

管件

商标

Infineon Technologies

商标名

OptiMOS

安装类型

通孔

安装风格

Through Hole

封装

Tube

封装/外壳

TO-220-3

封装/箱体

TO-220-3

工厂包装数量

500

晶体管极性

N-Channel

最大工作温度

+ 150 C

最小工作温度

- 55 C

标准包装

500

漏源极电压(Vdss)

200V

电流-连续漏极(Id)(25°C时)

9.5A (Tc)

系列

BUZ32

配置

Single

零件号别名

BUZ32HXKSA1 SP000682998

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PDF Datasheet 数据手册内容提取

BUZ 32 H SIPMOS® Power Transistor • N channel • Enhancement mode • Avalanche-rated Pin 1 Pin 2 Pin 3 G D S Type V I R Package Pb-free DS D DS(on) Ω BUZ 32 H 200 V 9.5 A 0.4 PG-TO-220-3 Yes Maximum Ratings Parameter Symbol Values Unit Continuous drain current I A D T = 29 ˚C 9.5 C Pulsed drain current I Dpuls T = 25 ˚C 38 C Avalanche current,limited by T I 9.5 jmax AR Avalanche energy,periodic limited by T E 6.5 mJ jmax AR Avalanche energy, single pulse E AS Ω I = 9.5 A, V = 50 V, R = 25 D DD GS L = 2 mH, T = 25 ˚C 120 j ± Gate source voltage V 20 V GS Power dissipation P W tot T = 25 ˚C 75 C Operating temperature T -55 ... + 150 ˚C j Storage temperature T -55 ... + 150 stg ≤ Thermal resistance, chip case R 1.67 K/W thJC Thermal resistance, chip to ambient R 75 thJA DIN humidity category, DIN 40 040 E IEC climatic category, DIN IEC 68-1 55 / 150 / 56 Rev. 2.4 Page 1 2009-11-10

BUZ 32 H Electrical Characteristics, at T= 25˚C, unless otherwise specified j Parameter Symbol Values Unit min. typ. max. Static Characteristics Drain- source breakdown voltage V V (BR)DSS V = 0 V, I = 0.25 mA, T = 25 ˚C 200 - - GS D j Gate threshold voltage V GS(th) VGS=VDS, ID = 1 mA 2.1 3 4 Zero gate voltage drain current I µA DSS V = 200 V, V = 0 V, T = 25 ˚C - 0.1 1 DS GS j V = 200 V, V = 0 V, T = 125 ˚C - 10 100 DS GS j Gate-source leakage current I nA GSS V = 20 V, V = 0 V - 10 100 GS DS Ω Drain-Source on-resistance R DS(on) V = 10 V, I = 6 A - 0.3 0.4 GS D Rev. 2.4 Page 2 2009-11-10

BUZ 32 H Electrical Characteristics, at T= 25˚C, unless otherwise specified j Parameter Symbol Values Unit min. typ. max. Dynamic Characteristics Transconductance g S fs ≥ VDS 2 * ID * RDS(on)max, ID = 6 A 3 4.6 - Input capacitance C pF iss V = 0 V, V = 25 V, f = 1 MHz - 400 530 GS DS Output capacitance C oss V = 0 V, V = 25 V, f = 1 MHz - 85 130 GS DS Reverse transfer capacitance C rss V = 0 V, V = 25 V, f = 1 MHz - 45 70 GS DS Turn-on delay time t ns d(on) V = 30 V, V = 10 V, I = 3 A DD GS D Ω R = 50 - 10 15 GS Rise time t r V = 30 V, V = 10 V, I = 3 A DD GS D Ω R = 50 - 40 60 GS Turn-off delay time t d(off) V = 30 V, V = 10 V, I = 3 A DD GS D Ω R = 50 - 55 75 GS Fall time t f V = 30 V, V = 10 V, I = 3 A DD GS D Ω R = 50 - 30 40 GS Rev. 2.4 Page 3 2009-11-10

BUZ 32 H Electrical Characteristics, at T= 25˚C, unless otherwise specified j Parameter Symbol Values Unit min. typ. max. Reverse Diode Inverse diode continuous forward current I A S T = 25 ˚C - - 9.5 C Inverse diode direct current,pulsed I SM T = 25 ˚C - - 38 C Inverse diode forward voltage V V SD V = 0 V, I = 19 A - 1.4 1.7 GS F Reverse recovery time t ns rr VR = 100 V, IF=lS, diF/dt = 100 A/µs - 200 - Reverse recovery charge Q µC rr VR = 100 V, IF=lS, diF/dt = 100 A/µs - 0.6 - Rev. 2.4 Page 4 2009-11-10

BUZ 32 H Drain current Power dissipation ƒ ƒ I = (T ) P = (T ) D C tot C ≥ parameter: V 10 V GS 10 80 A W I 8 P D tot 60 7 50 6 5 40 4 30 3 20 2 10 1 0 0 0 20 40 60 80 100 120 ˚C 160 0 20 40 60 80 100 120 ˚C 160 T T C C Safe operating area Transient thermal impedanc e I = ƒ(V ) Z = ƒ(t) D DS th JC p parameter: D = 0.01, T = 25˚C parameter: D = t / T C p 10 2 10 1 tp = 7 .6 µ s K/W A 10 µs ID 10 1 R D S ( o n ) = V D S / I D 100 µs ZthJC 10 0 1 ms 10 -1 D = 0.50 0.20 10 0 10 ms 0.10 0.05 10 -2 0.02 DC 0.01 single pulse 10 -1 10 -3 10 0 10 1 10 2 V 10 -7 10 -6 10 -5 10 -4 10 -3 10 -2 10 -1s 10 0 V t DS p Rev. 2.4 Page 5 2009-11-10

BUZ 32 H Typ. output characteristic s Typ. drain-source on-resistanc e I = ƒ(V ) R = ƒ(I ) D DS DS (on) D parameter: t = 80 µs parameter: V p GS 22 1.3 Ptot = 75W Ω A l k j a b c d e f g h i 18 VGS [V] 1.1 ID h a 4.0 RDS (on) 1.0 b 4.5 16 c 5.0 0.9 g 14 d 5.5 0.8 e 6.0 f 12 f 6.5 0.7 g 7.0 10 e h 7.5 0.6 i 8.0 0.5 8 j 9.0 d k 10.0 0.4 i 6 j l 20.0 c 0.3 k 4 0.2 b VVGGSS [[VV]] == 2 0.1 aa b c d e f g h i j k a 44..50 5.0 5.5 6.0 6.5 7.0 7.5 8.0 9.0 10.0 20.0 0 0.0 0 2 4 6 8 10 12 V 16 0 4 8 12 16 A 22 V I DS D Typ. transfer characteristics ID = f (VGS) Typ. forward transconductance gfs = f (ID) parameter: tp = 80 µs parameter: tp = 80 µs, VDS≥2 x ID x RDS(on)max VDS≥2 x ID x RDS(on)max 13 6.0 A S 11 5.0 ID 10 gfs 4.5 9 4.0 8 3.5 7 3.0 6 2.5 5 2.0 4 1.5 3 2 1.0 1 0.5 0 0.0 0 1 2 3 4 5 6 7 8 V 10 0 2 4 6 8 A 12 V I GS D Rev. 2.4 Page 6 2009-11-10

BUZ 32 H Gate threshold voltage Drain-source on-resistanc e ƒ ƒ V = (T) R = (T) GS (th) j DS (on) j parameter: V = V , I = 1 mA parameter: I = 6 A, V = 10 V GS DS D D GS 1.3 4.6 Ω V 98% 4.0 1.1 V R GS(th) 3.6 DS (on)1.0 0.9 3.2 typ 0.8 2.8 0.7 2.4 2% 0.6 98% 2.0 0.5 1.6 typ 0.4 1.2 0.3 0.8 0.2 0.4 0.1 0.0 0.0 -60 -20 20 60 100 ˚C 160 -60 -20 20 60 100 ˚C 160 T Tj j Typ. capacitances Forward characteristics of reverse dio de C = f (VDS) I = ƒ(V ) F SD parameter:VGS = 0V, f = 1MHz parameter: Tj, tp = 80 µs 10 1 10 2 nF A C I F 10 0 10 1 C iss 10 -1 10 0 C T = 25 ˚C typ oss j T = 150 ˚C typ C j rss T = 25 ˚C (98%) j T = 150 ˚C (98%) j 10 -2 10 -1 0 5 10 15 20 25 30 V 40 0.0 0.4 0.8 1.2 1.6 2.0 2.4 V 3.0 V V DS SD Rev. 2.4 Page 7 2009-11-10

BUZ 32 H ƒ Avalanche energy E = (T) Typ. gate charge AS j parameter: I = 9.5 A, V = 50 V V = ƒ(Q ) D DD GS Gate Ω R = 25 , L = 2 mH parameter: I = 14 A GS D puls 130 16 mJ V 110 E V AS 100 GS 12 90 80 10 0,2 V 0,8 V DS max DS max 70 8 60 50 6 40 4 30 20 2 10 0 0 20 40 60 80 100 120 ˚C 160 0 4 8 12 16 20 24 28 32 nC 38 T Q j Gate Drain-source breakdown voltage ƒ V = (T) (BR)DSS j 240 V 230 V (BR)DSS 225 220 215 210 205 200 195 190 185 180 -60 -20 20 60 100 ˚C 160 T j Rev. 2.4 Page 8 2009-11-10

Published by Infineon Technologies AG 81726 Munich, Germany © 2009 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.