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  • 型号: LIS3LV02DLTR
  • 制造商: STMicroelectronics
  • 库位|库存: xxxx|xxxx
  • 要求:
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+xxxx $xxxx ¥xxxx

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LIS3LV02DLTR产品简介:

ICGOO电子元器件商城为您提供LIS3LV02DLTR由STMicroelectronics设计生产,在icgoo商城现货销售,并且可以通过原厂、代理商等渠道进行代购。 LIS3LV02DLTR价格参考。STMicroelectronicsLIS3LV02DLTR封装/规格:运动传感器 - 加速计, Accelerometer X, Y, Z Axis ±2g, 6g 10Hz ~ 640Hz 16-LGA (4.4x7.5)。您可以下载LIS3LV02DLTR参考资料、Datasheet数据手册功能说明书,资料中有LIS3LV02DLTR 详细功能的应用电路图电压和使用方法及教程。

产品参数 图文手册 常见问题
参数 数值
产品目录

传感器,变送器

描述

IC MEMS INERTL SENSOR 3AX LGA16

产品分类

加速计

品牌

STMicroelectronics

数据手册

点击此处下载产品Datasheet

产品图片

产品型号

LIS3LV02DLTR

rohs

无铅 / 符合限制有害物质指令(RoHS)规范要求

产品系列

-

产品目录页面

点击此处下载产品Datasheet

供应商器件封装

16-LGA(4.4x7.5)

其它名称

497-8415-1

其它有关文件

http://www.st.com/web/catalog/sense_power/FM89/SC444/PF127514?referrer=70071840

加速度范围

±2g, 6g

安装类型

表面贴装

封装/外壳

16-VLGA

带宽

40Hz ~ 2.56kHz 可选

接口

I²C, SPI

标准包装

1

灵敏度

1024LSB/g,340LSB/g

电压-电源

2.16 V ~ 3.6 V

X,Y,Z

输出类型

I²C, SPI

配用

/product-detail/zh/STEVAL-IFS001V1/497-5069-ND/1059095

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PDF Datasheet 数据手册内容提取

LIS3LV02DL MEMS inertial sensor 3-axis - ±2g/±6g digital output low voltage linear accelerometer Features ■ 2.16 V to 3.6 V single supply operation ■ 1.8 V compatible IOs ■ I2C/SPI digital output interfaces ■ Programmable 12 or 16 bit data representation LGA-16 ■ Interrupt activated by motion ■ Programmable interrupt threshold The LIS3LV02DL has a user selectable full scale of ±2g, ±6g and it is capable of measuring ■ Embedded self test acceleration over a bandwidth of 640 Hz for all ■ High shock survivability axes. The device bandwidth may be selected ■ ECOPACK® compliant (see Section9) accordingly to the application requirements. The self-test capability allows the user to check Description the functioning of the device. The LIS3LV02DL is a three axes digital output The device may be also configured to generate an linear accelerometer that includes a sensing inertial wake-up/free-fall interrupt signal when a element and an IC interface able to take the programmable acceleration threshold is crossed information from the sensing element and to at least in one of the three axes. provide the measured acceleration signals to the The LIS3LV02DL is available in plastic SMD external world through an I2C/SPI serial interface. package and it is specified over a temperature The sensing element, capable of detecting the range extending from -40°C to +85°C. acceleration, is manufactured using a dedicated The LIS3LV02DL belongs to a family of products process developed by ST to produce inertial suitable for a variety of applications: sensors and actuators in silicon. – Free-Fall detection The IC interface instead is manufactured using a – Motion activated functions in portable CMOS process that allows high level of terminals integration to design a dedicated circuit which is – Antitheft systems and Inertial navigation factory trimmed to better match the sensing – Gaming and virtual reality input devices element characteristics. – Vibration monitoring and compensation Table 1. Device summary Operating temperature Order code Package Packing range [°C] LIS3LV02DL -40 to +85 LGA-16 Tray LIS3LV02DLTR -40 to +85 LGA-16 Tape and reel January 2008 Rev 2 1/48 www.st.com 48

Content LIS3LV02DL Content 1 Block diagram and pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 1.1 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 1.2 LGA-16 pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2 Mechanical and electrical specifications . . . . . . . . . . . . . . . . . . . . . . . 10 2.1 Mechanical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 2.2 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 2.3 Communication interface characteristics . . . . . . . . . . . . . . . . . . . . . . . . . 15 2.3.1 SPI - serial peripheral interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 2.3.2 I2C - Inter IC control interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 2.4 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 2.5 Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 2.5.1 Sensitivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 2.5.2 Zero-g level . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 2.5.3 Self test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 3 Functionality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 3.1 Sensing element . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 3.2 IC interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 3.3 Factory calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 4 Application hints . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 4.1 Soldering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 5 Digital interfaces . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 5.1 I2C serial interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 5.1.1 I2C operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 5.2 SPI bus interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 5.2.1 SPI read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 5.2.2 SPI write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 5.2.3 SPI Read in 3-wires mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 6 Register mapping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2/48

LIS3LV02DL Content 7 Register description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 7.1 WHO_AM_I (0Fh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 7.2 OFFSET_X (16h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 7.3 OFFSET_Y (17h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 7.4 OFFSET_Z (18h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 7.5 GAIN_X (19h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 7.6 GAIN_Y (1Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 7.7 GAIN_Z (1Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 7.8 CTRL_REG1 (20h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 7.9 CTRL_REG2 (21h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 7.10 CTRL_REG3 (22h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 7.11 HP_FILTER_RESET (23h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 7.12 STATUS_REG (27h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 7.13 OUTX_L (28h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 7.14 OUTX_H (29h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 7.15 OUTY_L (2Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 7.16 OUTY_H (2Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 7.17 OUTZ_L (2Ch) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 7.18 OUTZ_H (2Dh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 7.19 FF_WU_CFG (30h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 7.20 FF_WU_SRC (31h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 7.21 FF_WU_ACK (32h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 7.22 FF_WU_THS_L (34h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 7.23 FF_WU_THS_H (35h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 7.24 FF_WU_DURATION (36h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 7.25 DD_CFG (38h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 7.26 DD_SRC (39h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 7.27 DD_ACK (3Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 7.28 DD_THSI_L (3Ch) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 7.29 DD_THSI_H (3Dh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 7.30 DD_THSE_L (3Eh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 7.31 DD_THSE_H (3Fh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 3/48

Content LIS3LV02DL 8 Typical performance characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 8.1 Mechanical characteristics at 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 8.2 Mechanical characteristics derived from measurement in the -40°C to +85°C temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 8.3 Electro-mechanical characteristics at 25°C . . . . . . . . . . . . . . . . . . . . . . . 44 9 Package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 10 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 4/48

LIS3LV02DL List of figures List of figures Figure 1. Block diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Figure 2. Pin connection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Figure 3. SPI slave timing diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Figure 5. LIS3LV02DL electrical connection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Figure 6. Read and write protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Figure 7. SPI read protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Figure 8. Multiple bytes SPI read protocol (2 bytes example). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Figure 9. SPI write protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Figure 10. Multiple bytes SPI write protocol (2 bytes example). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Figure 11. SPI read protocol in 3-wires mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 Figure 12. X-axis zero-g level at 3.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 Figure 13. X-axis sensitivity at 3.3 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 Figure 14. Y-axis zero-g level at 3.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 Figure 15. Y-axis sensitivity at 3.3 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 Figure 16. Z-axis zero-g level at 3.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Figure 17. Z-axis Sensitivity at 3.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Figure 18. X-axis zero-g level change vs. temperature at 3.3 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Figure 19. X-axis sensitivity change vs. temperature at 3.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 Figure 20. Y-axis zero-g level change vs. temperature at 3.3 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Figure 21. Y-axis sensitivity change vs. temperature at 3.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Figure 22. Z-axis zero-g level change vs. temperature at 3.3 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Figure 23. Z-axis sensitivity change vs. temperature at 3.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Figure 24. X and Y axis zero-g level as function of supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Figure 25. Z axis zero-g level as function of supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 Figure 26. Current consumption in Power-Down mode (Vdd=3.3 V). . . . . . . . . . . . . . . . . . . . . . . . . . 42 Figure 27. Current consumption in operational mode (Vdd=3.3 V) . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 Figure 28. LGA-16 mechanical data and package dimensions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 5/48

List of tables LIS3LV02DL List of tables Table 1. Device summary. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Table 2. Pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Table 3. Mechanical characteristics @ Vdd=3.3 V, T=25 °C unless otherwise noted. . . . . . . . . . . . 5 Table 4. Mechanical characteristics @ Vdd=2.5 V, T=25 °C unless otherwise noted . . . . . . . . . . . . 7 Table 5. Electrical characteristics @ Vdd=3.3 V, T=25 °C unless otherwise noted . . . . . . . . . . . . . 9 Table 6. SPI Slave Timing Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Table 7. I2C slave timing values. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Table 8. Absolute maximum ratings. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Table 9. Serial interface pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Table 10. Serial interface pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Table 11. Transfer when master is writing one byte to slave . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Table 12. Transfer when master is writing multiple bytes to slave . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Table 13. Transfer when master is receiving (reading) one byte of data from slave . . . . . . . . . . . . . 18 Table 14. Transfer when master is receiving (reading) multiple bytes of data from slave . . . . . . . . . 18 Table 15. Registers address map. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Table 16. Register (0Fh). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Table 17. Register description (0Fh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Table 18. Register (16h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Table 19. Register description (16h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Table 20. Register (17h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Table 21. Register description (17h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Table 22. Register (18h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Table 23. Register description (18h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 24. Register (19h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 25. Register description (19h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 26. Register (1Ah). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 27. Register description (1Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 28. Register (1Bh). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 29. Register description (1Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 30. Register (20h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 31. Register description (20h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Table 32. Register (21h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 Table 33. Register description (21h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 Table 34. Register (22h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 Table 35. Register description (22h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 Table 36. Register (27h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 Table 37. Register description (27h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 Table 38. Register (28h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Table 39. Register description (28h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Table 40. Register (29h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Table 41. Register description (29h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Table 42. Register (2Ah). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Table 43. Register description (2Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 Table 44. Register (2Bh). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 Table 45. Register description (2Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 Table 46. Register (2Ch) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 Table 47. Register description (2Ch) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 Table 48. Register (2Dh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 6/48

LIS3LV02DL List of tables Table 49. Register description (2Dh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 Table 50. Register (30h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 Table 51. Register description (30h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 Table 52. Register (31h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Table 53. Register description (31h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Table 54. Register (34h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Table 55. Register description (34h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Table 56. Register (35h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Table 57. Register description (35h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 Table 58. Register (36h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 Table 59. Register description (36h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 Table 60. Register (38h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 Table 61. Register description (38h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 Table 62. Register (39h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 Table 63. Register description (39h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 Table 64. Register (3Ch) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Table 65. Register description (3Ch) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Table 66. Register (3Dh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Table 67. Register description (3Dh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Table 68. Register (3Eh). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Table 69. Register description (3Eh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Table 70. Register (3Fh). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Table 71. Register description (3Fh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 Table 72. Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 7/48

Block diagram and pin description LIS3LV02DL 1 Block diagram and pin description 1.1 Block diagram Figure 1. Block diagram X+ Σ∆ Reconstruction Y+ CHARGE Filter Z+ AMPLIFIER CS a MUX MDUEX Σ∆ RecoFnisltterurction RArergasy I2C SSCDAL//SSPDCO/SDI Z- SPI SDO Y- X- Σ∆ Reconstruction Filter TRIMMING CONTROL LOGIC RDY/INT SELF TEST REFERENCE CIRCUITS CLOCK & INTERRUPT GEN. 1.2 LGA-16 pin description Figure 2. Pin connection Z DO 1 Y CS SCL/SPC VDD_IO SDA/SDI/S SDO RDY/INT 6 1 NC7 LIS3LV02DL 16GND X (TOP VIEW) CK8 15 RES DIRECTION OF THE DETECTABLE 9 14 ACCELERATIONS D S D S D D N E D E D N G R V R V G Table 2. Pin description Pin# Name Function 1 RDY/INT Data ready/inertial wake-up interrupt 2 SDO SPI Serial Data Output 8/48

LIS3LV02DL Block diagram and pin description Table 2. Pin description Pin# Name Function SDA/ I2C Serial Data (SDA) 3 SDI/ SPI Serial Data Input (SDI) SDO 3-wire Interface Serial Data Output (SDO) 4 Vdd_IO Power supply for I/O pads I2C Serial Clock (SCL) 5 SCL/SPC SPI Serial Port Clock (SPC) SPI enable 6 CS I2C/SPI mode selection (1: I2C mode; 0: SPI enabled) 7 NC Internally not connected Optional external clock, if not used either leave unconnected or 8 CK connect to GND 9 GND 0 V supply 10 Reserved Either leave unconnected or connect to Vdd_IO 11 Vdd Power supply 12 Reserved Connect to Vdd 13 Vdd Power supply 14 GND 0 V supply 15 Reserved Either leave unconnected or connect to GND 16 GND 0 V supply 9/48

Mechanical and electrical specifications LIS3LV02DL 2 Mechanical and electrical specifications 2.1 Mechanical characteristics Table 3. Mechanical characteristics @ Vdd=3.3 V, T=25 °C unless otherwise noted(1) Symbol Parameter Test conditions Min. Typ.(2) Max. Unit FS bit set to 0 ±1.7 ±2.0 FS Measurement range(3) g FS bit set to 1 ±5.3 ±6.0 Full-scale = ±2 g 1.0 ODR1=40 Hz Full-scale = ±2 g 2.0 ODR2=160 Hz Dres Device resolution mg Full-scale = ±2 g 3.9 ODR3=640 Hz Full-scale = ±2 g 15.6 ODR4=2560 Hz Full-scale = ±2 g 920 1024 1126 12 bit representation So Sensitivity LSb/g Full-scale = ±6 g 306 340 374 12 bit representation Sensitivity change vs Full-scale = ±2 g TCSo 0.025 %/°C temperature 12 bit representation Full-scale = ±2 g -70 70 X, Y axis Full-scale = ±2 g -90 90 Zero-g level offset Z axis Off mg accuracy(4),(5) Full-scale = ±6 g -90 90 X, Y axis Full-scale = ±6 g -100 100 Z axis Full-scale = ±2 g -4.5 4.5 X, Y axis Full-scale = ±2 g -6 6 Zero-g Level offset long term Z axis LTOff %FS accuracy(6) Full-scale = ±6 g -1.8 1.8 X, Y axis Full-scale = ±6 g -2.2 2.2 Z axis Zero-g Level Change Vs TCOff Max Delta from 25°C 0.2 mg/°C Temperature 10/48

LIS3LV02DL Mechanical and electrical specifications Table 3. Mechanical characteristics @ Vdd=3.3 V, T=25 °C unless otherwise noted(1) (continued) Symbol Parameter Test conditions Min. Typ.(2) Max. Unit Best fit straight line X, Y axis ±2 Full-scale = ±2 g ODR=40 Hz NL Non Linearity %FS Best fit straight line Z axis ±3 Full-scale = ±2 g ODR=40 Hz CrAx Cross axis -3.5 3.5 % Full-scale= ±2g 250 550 900 LSb X axis Full-scale= ±2 g 250 550 900 LSb Y axis Full-scale= ±2 g -100 -350 -600 LSb Z axis Vst Self test output change(7),(8) Full-scale= ±6 g 80 180 300 LSb X axis Full-scale= ±6 g 80 180 300 LSb Y axis Full-scale= ±6 g -30 -120 -200 LSb Z axis BW System Bandwidth(9) ODRx/4 Hz Operating Temperature Top -40 +85 °C Range Wh Product Weight 72 mgram 1. The product is factory calibrated at 3.3 V. The device can be used from 2.16 V to 3.6 V 2. Typical specifications are not guaranteed 3. Verified by wafer level test and specification of initial offset and sensitivity 4. Zero-g level offset value after MSL3 preconditioning 5. Offset can be eliminated by enabling the built-in high pass filter (HPF) 6. Results of accelerated reliability tests 7. Self Test output changes with the power supply. “Self test output change” is defined as OUTPUT[LSb] (Self-test bit on - OUTPUT[LSb] . 1LSb=1g/1024 at 12bit representation, 2g Full-Scale ctrl_reg1=1) (Self-test bit on ctrl_reg1=0) 8. Output data reach 99% of final value after 5/ODR when enabling Self-Test mode due to device filtering 9. ODRx is output data rate. Refer to Table5 for specifications 11/48

Mechanical and electrical specifications LIS3LV02DL Table 4. Mechanical characteristics @ Vdd=2.5 V, T=25 °C unless otherwise noted(1) Symbol Parameter Test conditions Min. Typ.(2) Max. Unit FS bit set to 0 ±1.7 ±2.0 FS Measurement range(3) g FS bit set to 1 ±5.3 ±6.0 Full-scale = ±2g 1.0 ODR1=40Hz Full-scale = ±2g 2.0 ODR2=160Hz Dres Device resolution mg Full-scale = ±2g 3.9 ODR3=640Hz Full-scale = ±2g 15.6 ODR4=2560Hz Full-scale = ±2g 920 1024 1126 12 bit representation So Sensitivity LSb/g Full-scale = ±6g 306 340 374 12 bit representation Sensitivity change vs Full-scale = ±2g TCSo 0.025 %/°C temperature 12 bit representation Full-scale = ±2g -90 90 X, Y axis Full-scale = ±2g -110 110 Zero-g level offset Z axis Off mg accuracy(4),(5) Full-scale = ±6g -110 110 X, Y axis Full-scale = ±6g -120 120 Z axis Full-scale = ±2g -5.5 5.5 X, Y axis Full-scale = ±2g -7 7 Zero-g level offset long term Z axis LTOff %FS accuracy(6) Full-scale = ±6g -2.8 2.8 X, Y axis Full-scale = ±6g -3.2 3.2 Z axis Zero-g level change vs TCOff Max Delta from 25°C 0.2 mg/°C temperature 12/48

LIS3LV02DL Mechanical and electrical specifications Table 4. Mechanical characteristics @ Vdd=2.5 V, T=25 °C unless otherwise noted(1) (continued) Symbol Parameter Test conditions Min. Typ.(2) Max. Unit Best fit straight line X, Y axis ±2 Full-scale = ±2g ODR=40Hz NL Non linearity %FS Best fit straight line Z axis ±3 Full-scale = ±2g ODR=40Hz CrAx Cross axis -3.5 3.5 % Full-scale= ±2g 100 240 400 LSb X axis Full-scale= ±2g 100 240 400 LSb Y axis Full-scale= ±2g -30 -150 -350 LSb Z axis Vst Self test output change(7),(8) Full-scale= ±6g 30 80 130 LSb X axis Full-scale= ±6g 30 80 130 LSb Y axis Full-scale= ±6g -10 -50 -120 LSb Z axis BW System bandwidth(9) ODRx/4 Hz Top Operating temperature range -40 +85 °C Wh Product weight 72 mgram 1. The product is factory calibrated at 3.3 V. The device can be used from 2.16 V to 3.6 V 2. Typical specifications are not guaranteed 3. Verified by wafer level test and specification of initial offset and sensitivity 4. Zero-g level offset value after MSL3 preconditioning 5. Offset can be eliminated by enabling the built-in high pass filter (HPF) 6. Results of accelerated reliability tests 7. Self Test output changes with the power supply. “Self test output change” is defined as OUTPUT[LSb] (Self-test bit on - OUTPUT[LSb] . 1LSb=1g/1024 at 12bit representation, 2g Full-Scale ctrl_reg1=1) (Self-test bit on ctrl_reg1=0) 8. Output data reach 99% of final value after 5/ODR when enabling Self-Test mode due to device filtering 9. ODRx is output data rate. Refer to Table5 for specifications 13/48

Mechanical and electrical specifications LIS3LV02DL 2.2 Electrical characteristics Table 5. Electrical characteristics @ Vdd=3.3 V, T=25 °C unless otherwise noted (1) Symbol Parameter Test conditions Min. Typ.(2) Max. Unit Vdd Supply voltage 2.16 3.3 3.6 V Vdd_IO I/O pads supply voltage 1.71 Vdd V Vdd = 3.3 V 0.65 0.80 Idd Supply current mA Vdd = 2.5 V 0.60 0.75 Current consumption in IddPdn 1 10 µA Power-down mode Digital High level Input 0.8*Vdd VIH voltage _IO V Digital Low level Input 0.2*Vdd VIL voltage _IO 0.9*Vdd VOH High level output voltage _IO V 0.1*Vdd VOL Low level output voltage _IO ODR1 Output Data Rate 1 Dec factor = 512 40 ODR2 Output Data Rate 2 Dec factor = 128 160 Hz ODR3 Output Data Rate 3 Dec factor = 32 640 ODR4 Output Data Rate 4 Dec factor = 8 2560 BW System bandwidth(3) ODRx/4 Hz Ton Turn-on time (4) 5/ODRx s Top Operating temperature range -40 +85 °C 1. The product is factory calibrated at 3.3 V. The device can be used from 2.16 V to 3.6 V 2. Typical specifications are not guaranteed 3. Digital filter cut-off frequency 4. Time to obtain valid data after exiting Power-Down mode 14/48

LIS3LV02DL Mechanical and electrical specifications 2.3 Communication interface characteristics 2.3.1 SPI - serial peripheral interface Subject to general operating conditions for Vdd and Top. Table 6. SPI Slave Timing Values Value(1) Symbol Parameter Unit Min Max tc(SPC) SPI clock cycle 125 ns fc(SPC) SPI clock frequency 8 MHz tsu(CS) CS setup time 5 th(CS) CS hold time 10 tsu(SI) SDI input setup time 5 th(SI) SDI input hold time 15 ns tv(SO) SDO valid output time 55 th(SO) SDO output hold time 7 tdis(SO) SDO output disable time 50 1. Values are guaranteed at 8 MHz clock frequency for SPI with both 4 and 3 wires, based on characterization results, not tested in production Figure 3. SPI slave timing diagram (2) CS (3) (3) tsu(CS) tc(SPC) th(CS) SPC (3) (3) tsu(SI) th(SI) SDI (3) MSB IN LSB IN (3) tv(SO) th(SO) tdis(SO) SDO (3) MSB OUT LSB OUT (3) 2. Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both input and output port 3. When no communication is on-going, data on CS, SPC, SDI and SDO are driven by internal pull-up resistors 15/48

Mechanical and electrical specifications LIS3LV02DL 2.3.2 I2C - Inter IC control interface Subject to general operating conditions for Vdd and Top. Table 7. I2C slave timing values I2C standard mode (1) I2C fast mode (1) Symbol Parameter Unit Min Max Min Max f(SCL) SCL clock frequency 0 100 0 400 KHz tw(SCLL) SCL clock low time 4.7 1.3 µs tw(SCLH) SCL clock high time 4.0 0.6 tsu(SDA) SDA setup time 250 100 ns th(SDA) SDA data hold time 0(2) 3.45 0(2) 0.9 µs tr(SDA) tr(SCL) SDA and SCL rise time 1000 20 + 0.1Cb (3) 300 ns tf(SDA) tf(SCL) SDA and SCL fall time 300 20 + 0.1Cb (3) 300 th(ST) START condition hold time 4 0.6 Repeated START condition tsu(SR) setup time 4.7 0.6 µs tsu(SP) STOP condition setup time 4 0.6 Bus free time between STOP tw(SP:SR) and START condition 4.7 1.3 1. Data based on standard I2C protocol requirement, not tested in production 2. A device must internally provide an hold time of at least 300ns for the SDA signal (referred to VIHmin of the SCL signal) to bridge the undefined region of the falling edge of SCL 3. Cb = total capacitance of one bus line, in pF Figure 4. I2C slave timing diagram (4) REPEATED START START tsu(SR) SDA tw(SP:SR) START tf(SDA) tr(SDA) tsu(SDA) th(SDA) tsu(SP) STOP SCL th(ST) tw(SCLL) tw(SCLH) tr(SCL) tf(SCL) 4.Measurement points are done at 0.2·Vdd_IO and 0.8·Vdd_IO, for both port 16/48

LIS3LV02DL Mechanical and electrical specifications 2.4 Absolute maximum ratings Stresses above those listed as “absolute maximum ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device under these conditions is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. T able 8. Absolute maximum ratings Symbol Ratings Maximum Value Unit Vdd Supply voltage -0.3 to 6 V Vdd_IO I/O pins Supply voltage -0.3 to Vdd +0.1 V Input voltage on any control pin Vin -0.3 to Vdd_IO +0.3 V (CS, SCL/SPC, SDA/SDI/SDO, CK) 3000g for 0.5 ms APOW Acceleration (Any axis, Powered, Vdd=3.3 V) 10000g for 0.1 ms 3000g for 0.5 ms AUNP Acceleration (any axis, unpowered) 10000g for 0.1 ms TOP Operating temperature range -40 to +85 °C TSTG Storage temperature range -40 to +125 °C 4.0 (HBM) kV ESD Electrostatic discharge protection 200 (MM) V 1.5 (CDM) kV Note: Supply voltage on any pin should never exceed 6.0 V. This is a Mechanical Shock sensitive device, improper handling can cause permanent damages to the part This is an ESD sensitive device, improper handling can cause permanent damages to the part 17/48

Mechanical and electrical specifications LIS3LV02DL 2.5 Terminology 2.5.1 Sensitivity Sensitivity describes the gain of the sensor and can be determined e.g. by applying 1g acceleration to it. As the sensor can measure DC accelerations this can be done easily by pointing the axis of interest towards the center of the Earth, noting the output value, rotating the sensor by 180 degrees (point to the sky) and noting the output value again. By doing so, ±1g acceleration is applied to the sensor. Subtracting the larger output value from the smaller one and dividing the result by 2 leads to the actual sensitivity of the sensor. This value changes very little over temperature and also very little over time. The Sensitivity Tolerance describes the range of Sensitivities of a large population of sensors. 2.5.2 Zero-g level Zero-g level Offset (Off) describes the deviation of an actual output signal from the ideal output signal if there is no acceleration present. A sensor in a steady state on a horizontal surface will measure 0g in X axis and 0g in Y axis whereas the Z axis will measure 1g. The output is ideally in the middle of the dynamic range of the sensor (content of OUT registers 00h, 00h with 16 bit representation, data expressed as 2’s complement number). A deviation from ideal value in this case is called Zero-g offset. Offset is to some extent a result of stress to a precise MEMS sensor and therefore the offset can slightly change after mounting the sensor onto a printed circuit board or exposing it to extensive mechanical stress. Offset changes little over temperature, see “Zero-g level change vs. temperature”. The Zero-g level of an individual sensor is stable over lifetime. The Zero-g level tolerance describes the range of Zero-g levels of a population of sensors. 2.5.3 Self test Self Test allows to test the mechanical and electric part of the sensor, allowing the seismic mass to be moved by means of an electrostatic test-force. The Self Test function is off when the self-test bit of CTRL_REG1 (control register 1) is programmed to ‘0‘. When the self-test bit of CTRL_REG1 is programmed to ‘1‘ an actuation force is applied to the sensor, simulating a definite input acceleration. In this case the sensor outputs will exhibit a change in their DC levels which is related to the selected full scale and depending on the Supply Voltage through the device sensitivity. When Self Test is activated, the device output level is given by the algebraic sum of the signals produced by the acceleration acting on the sensor and by the electrostatic test-force. If the output signals change within the amplitude specified inside Table3 or 4 then the sensor is working properly and the parameters of the interface chip are within the defined specification. 18/48

LIS3LV02DL Functionality 3 Functionality The LIS3LV02DL is a high performance, low-power, digital output 3-axis linear accelerometer packaged in an LGA package. The complete device includes a sensing element and an IC interface able to take the information from the sensing element and to provide a signal to the external world through an I2C/SPI serial interface. 3.1 Sensing element A proprietary process is used to create a surface micro-machined accelerometer. The technology allows to carry out suspended silicon structures which are attached to the substrate in a few points called anchors and are free to move in the direction of the sensed acceleration. To be compatible with the traditional packaging techniques a cap is placed on top of the sensing element to avoid blocking the moving parts during the moulding phase of the plastic encapsulation. When an acceleration is applied to the sensor the proof mass displaces from its nominal position, causing an imbalance in the capacitive half-bridge. This imbalance is measured using charge integration in response to a voltage pulse applied to the sense capacitor. At steady state the nominal value of the capacitors are few pF and when an acceleration is applied the maximum variation of the capacitive load is up to 100fF. 3.2 IC interface The complete measurement chain is composed by a low-noise capacitive amplifier which converts into an analog voltage the capacitive unbalancing of the MEMS sensor and by three Σ∆ analog-to-digital converters, one for each axis, that translate the produced signal into a digital bitstream. The Σ∆ converters are coupled with dedicated reconstruction filters which remove the high frequency components of the quantization noise and provide low rate and high resolution digital words. The charge amplifier and the Σ∆ converters are operated respectively at 61.5 kHz and 20.5 kHz. The data rate at the output of the reconstruction depends on the user selected Decimation Factor (DF) and spans from 40 Hz to 2560 Hz. The acceleration data may be accessed through an I2C/SPI interface thus making the device particularly suitable for direct interfacing with a microcontroller. The LIS3LV02DL features a Data-Ready signal (RDY) which indicates when a new set of measured acceleration data is available thus simplifying data synchronization in digital system employing the device itself. The LIS3LV02DL may also be configured to generate an inertial Wake-Up, Direction Detection and Free-Fall interrupt signal accordingly to a programmed acceleration event along the enabled axes. 19/48

Functionality LIS3LV02DL 3.3 Factory calibration The IC interface is factory calibrated for sensitivity (So) and Zero-g level (Off). The trimming values are stored inside the device by a non volatile structure. Any time the device is turned on, the trimming parameters are downloaded into the registers to be employed during the normal operation. This allows the user to employ the device without further calibration. 20/48

LIS3LV02DL Application hints 4 Application hints Figure 5. LIS3LV02DL electrical connection Vdd_IO Z CS SCL/SPC SDA/SDI/SDO SDO RDY/INT 1 Y 6 1 X 7 LIS3LV02DL 16 DIRECTION OF THE (TOP VIEW) 8 15 DETECTABLE ACCELERATIONS 9 14 Vdd 100nF 10uF GND Digital signal from/to signal controller.Signal’s levels are defined by proper selection of Vdd_IO The device core is supplied through Vdd line while the I/O pads are supplied through Vdd_IO line. Power supply decoupling capacitors (100 nF ceramic, 10 µF Al) should be placed as near as possible to the pin 13 of the device (common design practice). All the voltage and ground supplies must be present at the same time to have proper behavior of the IC (refer to Figure7). It is possible to remove Vdd maintaining Vdd_IO without blocking the communication busses. In this condition the measurement chain is powered off. The functionality of the device and the measured acceleration data is selectable and accessible through the I2C/SPI interface.When using the I2C, CS must be tied high while SDO must be left floating. Refer to dedicated application note for further information on device usage. The functions, the trasholds and the timing of the interrupt pin (INT) can be completely programmed by the user through the I2C/SPI interface. 4.1 Soldering Information The LGA-16 package is compliant with the ECOPACK®, RoHS and “Green” standard. It is qualified for soldering heat resistance according to JEDEC J-STD-020C. Leave “Pin 1 Indicator” unconnected during soldering. Land pattern and soldering recommendations are available at www.st.com/mems. 21/48

Digital interfaces LIS3LV02DL 5 Digital interfaces The registers embedded inside the LIS3LV02DL may be accessed through both the I2C and SPI serial interfaces. The latter may be SW configured to operate either in 3-wire or 4-wire interface mode. The serial interfaces are mapped onto the same pads. To select/exploit the I2C interface, CS line must be tied high (i.e connected to Vdd_IO). Table 9. Serial interface pin description Pin name Pin description SPI enable CS I2C/SPI mode selection (1: I2C mode; 0: SPI enabled) I2C Serial Clock (SCL) SCL/SPC SPI Serial Port Clock (SPC) I2C Serial Data (SDA) SDA/SDI/SDO SPI Serial Data Input (SDI) 3-wire Interface Serial Data Output (SDO) SDO SPI Serial Data Output (SDO) 2 5.1 I C serial interface The LIS3LV02DL I2C is a bus slave. The I2C is employed to write the data into the registers whose content can also be read back. The relevant I2C terminology is given in the table below. T able 10. Serial interface pin description Term Description Transmitter The device which sends data to the bus Receiver The device which receives data from the bus The device which initiates a transfer, generates clock signals and terminates a Master transfer Slave The device addressed by the master There are two signals associated with the I2C bus: the Serial Clock Line (SCL) and the Serial DAta line (SDA). The latter is a bidirectional line used for sending and receiving the data to/from the interface. Both the lines are connected to Vdd_IO through a pull-up resistor embedded inside the LIS3LV02DL. When the bus is free both the lines are high. The I2C interface is compliant with Fast Mode (400 kHz) I2C standards as well as the Normal Mode. 22/48

LIS3LV02DL Digital interfaces 5.1.1 I2C operation The transaction on the bus is started through a START (ST) signal. A START condition is defined as a HIGH to LOW transition on the data line while the SCL line is held HIGH. After this has been transmitted by the Master, the bus is considered busy. The next byte of data transmitted after the start condition contains the address of the slave in the first 7 bits and the eighth bit tells whether the Master is receiving data from the slave or transmitting data to the slave. When an address is sent, each device in the system compares the first seven bits after a start condition with its address. If they match, the device considers itself addressed by the Master. The Slave ADdress (SAD) associated to the LIS3LV02DL is 0011101b. Data transfer with acknowledge is mandatory. The transmitter must release the SDA line during the acknowledge pulse. The receiver must then pull the data line LOW so that it remains stable low during the HIGH period of the acknowledge clock pulse. A receiver which has been addressed is obliged to generate an acknowledge after each byte of data received. The I2C embedded inside the LIS3LV02DL behaves like a slave device and the following protocol must be adhered to. After the start condition (ST) a salve address is sent, once a slave acknowledge (SAK) has been returned, a 8-bit sub-address will be transmitted: the 7 LSb represent the actual register address while the MSB enables address auto increment. If the MSb of the SUB field is 1, the SUB (register address) will be automatically incremented to allow multiple data read/write. The slave address is completed with a Read/Write bit. If the bit was ‘1’ (Read), a repeated START (SR) condition will have to be issued after the two sub-address bytes; if the bit is ‘0’ (Write) the Master will transmit to the slave with direction unchanged. Table 11. Transfer when master is writing one byte to slave Master ST SAD + W SUB DATA SP Slave SAK SAK SAK Table 12. Transfer when master is writing multiple bytes to slave Master ST SAD + W SUB DATA DATA SP Slave SAK SAK SAK SAK Table 13. Transfer when master is receiving (reading) one byte of data from slave Master ST SAD + W SUB SR SAD + R NMAK SP Slave SAK SAK SAK DATA Table 14. Transfer when master is receiving (reading) multiple bytes of data from slave Master ST SAD+W SUB SR SAD+R MAK MAK NMAK SP Slave SAK SAK SAK DATA DATA DATA 23/48

Digital interfaces LIS3LV02DL Data are transmitted in byte format (DATA). Each data transfer contains 8 bits. The number of bytes transferred per transfer is unlimited. DATA is transferred with the Most Significant bit (MSb) first. If a receiver can’t receive another complete byte of data until it has performed some other function, it can hold the clock line, SCL LOW to force the transmitter into a wait state. Data transfer only continues when the receiver is ready for another byte and releases the data line. If a slave receiver doesn’t acknowledge the slave address (i.e. it is not able to receive because it is performing some real time function) the data line must be left HIGH by the slave. The Master can then abort the transfer. A LOW to HIGH transition on the SDA line while the SCL line is HIGH is defined as a STOP condition. Each data transfer must be terminated by the generation of a STOP (SP) condition. In order to read multiple bytes, it is necessary to assert the most significant bit of the sub- address field. In other words, SUB(7) must be equal to ‘1’ while SUB(6-0) represents the address of first register to read. In the presented communication format MAK is Master Acknowledge and NMAK is No Master Acknowledge. 5.2 SPI bus interface The LIS3LV02DL SPI is a bus slave. The SPI allows to write and read the registers of the device. The serial interface interacts with the outside world with 4 wires: CS, SPC, SDI and SDO. Figure 6. Read and write protocol CS SPC SDI RW DI7 DI6 DI5 DI4 DI3 DI2 DI1 DI0 MS AD5 AD4AD3 AD2 AD1 AD0 SDO DO7DO6DO5DO4DO3DO2DO1DO0 CS is the Serial Port Enable and it is controlled by the SPI master. It goes low at the start of the transmission and goes back high at the end. SPC is the Serial Port Clock and it is controlled by the SPI master. It is stopped high when CS is high (no transmission). SDI and SDO are respectively the Serial Port Data Input and Output. Those lines are driven at the falling edge of SPC and should be captured at the rising edge of SPC. Both the Read Register and Write Register commands are completed in 16 clock pulses or in multiple of 8 in case of multiple byte read/write. Bit duration is the time between two falling edges of SPC. The first bit (bit 0) starts at the first falling edge of SPC after the falling edge of CS while the last bit (bit 15, bit 23, ...) starts at the last falling edge of SPC just before the rising edge of CS. 24/48

LIS3LV02DL Digital interfaces bit 0: RW bit. When 0, the data DI(7:0) is written into the device. When 1, the data DO(7:0) from the device is read. In latter case, the chip will drive SDO at the start of bit 8. bit 1: MS bit. When 0, the address will remain unchanged in multiple read/write commands. When 1, the address will be auto incremented in multiple read/write commands. bit 2-7: address AD(5:0). This is the address field of the indexed register. bit 8-15: data DI(7:0) (write mode). This is the data that will be written into the device (MSb first). bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb first). In multiple read/write commands further blocks of 8 clock periods will be added. When MS bit is 0 the address used to read/write data remains the same for every block. When MS bit is ‘1’ the address used to read/write data is incremented at every block. The function and the behavior of SDI and SDO remain unchanged. 5.2.1 SPI read Figure 7. SPI read protocol CS SPC SDI RW MSAD5AD4AD3AD2AD1AD0 SDO DO7DO6DO5DO4DO3DO2DO1DO0 The SPI Read command is performed with 16 clock pulses. Multiple byte read command is performed adding blocks of 8 clock pulses at the previous one. bit 0: READ bit. The value is 1. bit 1: MS bit. When 0 do not increment address, when 1 increment address in multiple reading. bit 2-7: address AD(5:0). This is the address field of the indexed register. bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb first). bit 16-... : data DO(...-8). Further data in multiple byte reading. 25/48

Digital interfaces LIS3LV02DL Figure 8. Multiple bytes SPI read protocol (2 bytes example) CS SPC SDI RW MS AD5AD4AD3AD2AD1AD0 SDO DO7DO6DO5DO4DO3DO2DO1DO0DO15D O14D O13D O12D O11D O10D O9DO8 5.2.2 SPI write Figure 9. SPI write protocol CS SPC SDI RW DI7 DI6 DI5 DI4 DI3 DI2 DI1 DI0 MS AD5 AD4AD3 AD2 AD1 AD0 The SPI Write command is performed with 16 clock pulses. Multiple byte write command is performed adding blocks of 8 clock pulses at the previous one. bit 0: WRITE bit. The value is 0. bit 1: MS bit. When 0 do not increment address, when 1 increment address in multiple writing. bit 2 -7: address AD(5:0). This is the address field of the indexed register. bit 8-15: data DI(7:0) (write mode). This is the data that will be written inside the device (MSb first). bit 16-... : data DI(...-8). Further data in multiple byte writing. Figure 10. Multiple bytes SPI write protocol (2 bytes example) CS SPC SDI DI7 DI6 DI5 DI4 DI3 DI2 DI1 DI0 DI15 DI14 DI13 DI12 DI11 DI10 DI9 DI8 RW MSAD5AD4AD3AD2AD1AD0 26/48

LIS3LV02DL Digital interfaces 5.2.3 SPI Read in 3-wires mode 3-wires mode is entered by setting to ‘1’ bit SIM (SPI Serial Interface Mode selection) in CTRL_REG2. Figure 11. SPI read protocol in 3-wires mode CS SPC SDI/O RW DO7 DO6 DO5 DO4 DO3 DO2 DO1 DO0 MS AD5 AD4 AD3 AD2 AD1 AD0 The SPI Read command is performed with 16 clock pulses: bit 0: READ bit. The value is 1. bit 1: MS bit. When 0 do not increment address, when 1 increment address in multiple reading. bit 2-7: address AD(5:0). This is the address field of the indexed register. bit 8-15: data DO(7:0) (read mode). This is the data that will be read from the device (MSb first). Multiple read command is also available in 3-wires mode. 27/48

Register mapping LIS3LV02DL 6 Register mapping The table given below provides a listing of the 8 bit registers embedded in the device and the related addresses. Table 15. Registers address map Register address Register name Type Default Comment Binary Hex rw 0000000 - 0001110 00 - 0E Reserved WHO_AM_I r 0001111 0F 00111010 Dummy register rw 0010000 - 0010101 10-15 Reserved OFFSET_X rw 0010110 16 Calibration Loaded at boot OFFSET_Y rw 0010111 17 Calibration Loaded at boot OFFSET_Z rw 0011000 18 Calibration Loaded at boot GAIN_X rw 0011001 19 Calibration Loaded at boot GAIN_Y rw 0011010 1A Calibration Loaded at boot GAIN_Z rw 0011011 1B Calibration Loaded at boot 0011100 -0011111 1C-1F Reserved CTRL_REG1 rw 0100000 20 00000111 CTRL_REG2 rw 0100001 21 00000000 CTRL_REG3 rw 0100010 22 00001000 HP_FILTER RESET r 0100011 23 dummy Dummy register 0100100-0100110 24-26 Not Used STATUS_REG rw 0100111 27 00000000 OUTX_L r 0101000 28 output OUTX_H r 0101001 29 output OUTY_L r 0101010 2A output OUTY_H r 0101011 2B output OUTZ_L r 0101100 2C output OUTZ_H r 0101101 2D output r 0101110 2E Reserved 0101111 2F Not Used FF_WU_CFG rw 0110000 30 00000000 FF_WU_SRC rw 0110001 31 00000000 FF_WU_ACK r 0110010 32 dummy Dummy register 0110011 33 Not Used FF_WU_THS_L rw 0110100 34 00000000 28/48

LIS3LV02DL Register mapping Table 15. Registers address map (continued) Register address Register name Type Default Comment Binary Hex FF_WU_THS_H rw 0110101 35 00000000 FF_WU_DURATION rw 0110110 36 00000000 0110111 37 Not Used DD_CFG rw 0111000 38 00000000 DD_SRC rw 0111001 39 00000000 DD_ACK r 0111010 3A dummy Dummy register 0111011 3B Not Used DD_THSI_L rw 0111100 3C 00000000 DD_THSI_H rw 0111101 3D 00000000 DD_THSE_L rw 0111110 3E 00000000 DD_THSE_H rw 0111111 3F 00000000 1000000-1111111 40-7F Reserved Registers marked as Reserved must not be changed. The writing to those registers may cause permanent damages to the device. The content of the registers that are loaded at boot should not be changed. They contain the factory calibration values. Their content is automatically restored when the device is powered-up. 29/48

Register description LIS3LV02DL 7 Register description The device contains a set of registers which are used to control its behavior and to retrieve acceleration data. The registers 7.2 to 7.7 contain the factory calibration values, it is not necessary to change their value for normal device operation. 7.1 WHO_AM_I (0Fh) Table 16. Register (0Fh) W7 W6 W5 W4 W3 W2 W1 W0 Table 17. Register description (0Fh) W7, W0 LIS3LV02DL Physical Address equal to 3Ah Addressing this register the physical address of the device is returned. For LIS3LV02DL the physical address assigned in factory is 3Ah. 7.2 OFFSET_X (16h) Table 18. Register (16h) OX7 OX6 OX5 OX4 OX3 OX2 OX1 OX0 Table 19. Register description (16h) OX7, OX0 Digital Offset Trimming for X-Axis 7.3 OFFSET_Y (17h) Table 20. Register (17h) OY7 OY6 OY5 OY4 OY3 OY2 OY1 OY0 Table 21. Register description (17h) OY7, OY0 Digital Offset Trimming for Y-Axis 7.4 OFFSET_Z (18h) Table 22. Register (18h) OZ7 OZ6 OZ5 OZ4 OZ3 OZ2 OZ1 OZ0 30/48

LIS3LV02DL Register description Table 23. Register description (18h) OZ7, OZ0 Digital Offset Trimming for Z-Axis 7.5 GAIN_X (19h) Table 24. Register (19h) GX7 GX6 GX5 GX4 GX3 GX2 GX1 GX0 Table 25. Register description (19h) GX7, GX0 Digital Gain Trimming for X-Axis 7.6 GAIN_Y (1Ah) Table 26. Register (1Ah) GY7 GY6 GY5 GY4 GY3 GY2 GY1 GY0 Table 27. Register description (1Ah) GY7, GY0 Digital Gain Trimming for Y-Axis 7.7 GAIN_Z (1Bh) Table 28. Register (1Bh) GZ7 GZ6 GZ5 GZ4 GZ3 GZ2 GZ1 GZ0 Table 29. Register description (1Bh) GZ7, GZ0 Digital Gain Trimming for Z-Axis 7.8 CTRL_REG1 (20h) Table 30. Register (20h) PD1 PD0 DF1 DF0 ST Zen Yen Xen Table 31. Register description (20h) Power Down Control PD1, PD0 (00: power-down mode; 01, 10, 11: device on) Decimation Factor Control DF1, DF0 (00: decimate by 512; 01: decimate by 128; 10: decimate by 32; 11: decimate by 8) 31/48

Register description LIS3LV02DL Table 31. Register description (continued) (20h) Self Test Enable ST (0: normal mode; 1: self-test active) Z-axis enable Zen (0: axis off; 1: axis on) Y-axis enable Yen (0: axis off; 1: axis on) X-axis enable Xen (0: axis off; 1: axis on) PD1, PD0 bit allows to turn the device out of power-down mode. The device is in power- down mode when PD1, PD0= “00” (default value after boot). The device is in normal mode when either PD1 or PD0 is set to 1. DF1, DF0 bit allows to select the data rate at which acceleration samples are produced. The default value is “00” which corresponds to a data-rate of 40 Hz. By changing the content of DF1, DF0 to “01”, “10” and “11” the selected data-rate will be set respectively equal to 160 Hz, 640 Hz and to 2560 Hz. ST bit is used to activate the self test function. When the bit is set to one, an output change will occur to the device outputs (refer to table 2 and 3 for specification) thus allowing to check the functionality of the whole measurement chain. Zen bit enables the Z-axis measurement channel when set to 1. The default value is 1. Yen bit enables the Y-axis measurement channel when set to 1. The default value is 1. Xen bit enables the X-axis measurement channel when set to 1. The default value is 1. 7.9 CTRL_REG2 (21h) Table 32. Register (21h) FS BDU BLE BOOT IEN DRDY SIM DAS Table 33. Register description (21h) Full Scale selection FS (0: ±2g; 1: ±6g) Block Data Update BDU (0: continuous update; 1: output registers not updated between MSB and LSB reading) Big/Little Endian selection BLE (0: little endian; 1: big endian) BOOT Reboot memory content Interrupt ENable IEN (0: data ready on RDY pad; 1: interrupt events on RDY pad) DRDY Enable Data-Ready generation 32/48

LIS3LV02DL Register description Table 33. Register description (continued) (21h) SPI Serial Interface Mode selection SIM (0: 4-wire interface; 1: 3-wire interface) Data Alignment Selection DAS (0: 12 bit right justified; 1: 16 bit left justified) FS bit is used to select Full Scale value. After the device power-up the default full scale value is +/-2g. In order to obtain a +/-6g full scale it is necessary to set FS bit to ‘1’. BDU bit is used to inhibit output registers update between the reading of upper and lower register parts. In default mode (BDU = ‘0’) the lower and upper register parts are updated continuously. If it is not sure to read faster than output data rate, it is recommended to set BDU bit to ‘1’. In this way, after the reading of the lower (upper) register part, the content of that output registers is not updated until the upper (lower) part is read too. This feature avoids reading LSB and MSB related to different samples. BLE bit is used to select Big Endian or Little Endian representation for output registers. In Big Endian’s one MSB acceleration value is located at addresses 28h (X-axis), 2Ah (Y-axis) and 2Ch (Z-axis) while LSB acceleration value is located at addresses 29h (X-axis), 2Bh (Y- axis) and 2Dh (Z-axis). In Little Endian representation (Default, BLE=‘0‘) the order is inverted (refer to data register description for more details). BOOT bit is used to refresh the content of internal registers stored in the flash memory block. At the device power up the content of the flash memory block is transferred to the internal registers related to trimming functions to permit a good behavior of the device itself. If for any reason the content of trimming registers was changed it is sufficient to use this bit to restore correct values. When BOOT bit is set to ‘1’ the content of internal flash is copied inside corresponding internal registers and it is used to calibrate the device. These values are factory trimmed and they are different for every accelerometer. They permit a good behavior of the device and normally they have not to be changed. At the end of the boot process the BOOT bit is set again to ‘0’. IEN bit is used to switch the value present on data-ready pad between Data-Ready signal and Interrupt signal. At power up the Data-ready signal is chosen. It is however necessary to modify DRDY bit to enable Data-Ready signal generation. DRDY bit is used to enable Data-Ready (RDY/INT) pin activation. If DRDY bit is ‘0’ (default value) on Data-Ready pad a ‘0’ value is present. If a Data-Ready signal is desired it is necessary to set to ‘1’ DRDY bit. Data-Ready signal goes to ‘1’ whenever a new data is available for all the enabled axis. For example if Z-axis is disabled, Data-Ready signal goes to ‘1’ when new values are available for both X and Y axis. Data-Ready signal comes back to ‘0’ when all the registers containing values of the enabled axis are read. To be sure not to loose any data coming from the accelerometer data registers must be read before a new Data-Ready rising edge is generated. In this case Data-ready signal will have the same frequency of the data rate chosen. SIM bit selects the SPI Serial Interface Mode. When SIM is ‘0’ (default value) the 4-wire interface mode is selected. The data coming from the device are sent to SDO pad. In 3-wire interface mode output data are sent to SDA/SDI pad. DAS bit permits to decide between 12 bit right justified and 16 bit left justified representation of data coming from the device. The first case is the default case and the most significant bits are replaced by the bit representing the sign. 33/48

Register description LIS3LV02DL 7.10 CTRL_REG3 (22h) Table 34. Register (22h) ECK HPDD HPFF FDS res res CFS1 CFS0 Table 35. Register description (22h) External Clock. Default value: 0 ECK (0: clock from internal oscillator; 1: clock from external pad) High Pass filter enabled for Direction Detection. Default value: 0 HPDD (0: filter bypassed; 1: filter enabled) High Pass filter enabled for Free-Fall and Wake-Up. Default value: 0 HPFF (0: filter bypassed; 1: filter enabled) Filtered Data Selection. Default value: 0 FDS (0: internal filter bypassed; 1: data from internal filter) High-pass filter Cut-off Frequency Selection. Default value: 00 (00: Hpc=512 CFS1, CFS0 01: Hpc=1024 10: Hpc=2048 11: Hpc=4096) FDS bit enables (FDS=1) or bypass (FDS=0) the high pass filter in the signal chain of the sensor. CFS1, CFS0 bits defines the coefficient Hpc to be used to calculate the -3dB cut-off frequency of the high pass filter: 0.318 ODRx f = --------------- ⋅ ----------------- cutoff Hpc 2 7.11 HP_FILTER_RESET (23h) Dummy register. Reading at this address zeroes instantaneously the content of the internal high pass-filter. Read data is not significant. 7.12 STATUS_REG (27h) Table 36. Register (27h) ZYXOR ZOR YOR XOR ZYXDA ZDA YDA XDA Table 37. Register description (27h) ZYXOR X, Y and Z axis Data Overrun ZOR Z axis Data Overrun YOR Y axis Data Overrun XOR X axis Data Overrun 34/48

LIS3LV02DL Register description Table 37. Register description (continued) (27h) ZYXDA X, Y and Z axis new Data Available ZDA Z axis new Data Available YDA Y axis new Data Available XDA X axis new Data Available The content of this register is updated every ODR cycle, regardless of BDU bit value in CTRL_REG2. 7.13 OUTX_L (28h) Table 38. Register (28h) XD7 XD6 XD5 XD4 XD3 XD2 XD1 XD0 Table 39. Register description (28h) XD7, XD0 X axis acceleration data LSB In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the MSB acceleration data and depends on bit DAS in CTRL_REG2 register as described in the following section. 7.14 OUTX_H (29h) Table 40. Register (29h) XD15 XD14 XD13 XD12 XD11 XD10 XD9 XD8 Table 41. Register description (29h) XD15, XD8 X axis acceleration data MSB When reading the register in “12 bit right justified” mode the most significant bits (15:12) are replaced with bit 11 (i.e. XD15-XD12=XD11, XD11, XD11, XD11). In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the LSB acceleration data. 7.15 OUTY_L (2Ah) Table 42. Register (2Ah) YD7 YD6 YD5 YD4 YD3 YD2 YD1 YD0 35/48

Register description LIS3LV02DL Table 43. Register description (2Ah) YD7, YD0 Y axis acceleration data LSB In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the MSB acceleration data and depends on bit DAS in CTRL_REG2 register as described in the following section. 7.16 OUTY_H (2Bh) Table 44. Register (2Bh) YD15 YD14 YD13 YD12 YD11 YD10 YD9 YD8 Table 45. Register description (2Bh) YD15, YD8 Y axis acceleration data MSB When reading the register in “12 bit right justified” mode the most significant bits (15:12) are replaced with bit 11 (i.e. YD15-YD12=YD11, YD11, YD11, YD11). In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the LSB acceleration data. 7.17 OUTZ_L (2Ch) Table 46. Register (2Ch) ZD7 ZD6 ZD5 ZD4 ZD3 ZD2 ZD1 ZD0 Table 47. Register description (2Ch) ZD7, ZD0 Z axis acceleration data LSB In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the MSB acceleration data and depends on bit DAS in CTRL_REG2 register as described in the following section. 7.18 OUTZ_H (2Dh) Table 48. Register (2Dh) ZD15 ZD14 ZD13 ZD12 ZD11 ZD10 ZD9 ZD8 Table 49. Register description (2Dh) ZD15, ZD8 Z axis acceleration data MSB When reading the register in “12 bit right justified” mode the most significant bits (15:12) are replaced with bit 11 (i.e. ZD15-ZD12=ZD11, ZD11, ZD11, ZD11). 36/48

LIS3LV02DL Register description In Big Endian Mode (bit BLE in CTRL_REG2 set to ‘1’) the content of this register is the LSB acceleration data. 7.19 FF_WU_CFG (30h) Table 50. Register (30h) AOI LIR ZHIE ZLIE YHIE YLIE XHIE XLIE Table 51. Register description (30h) And/Or combination of Interrupt events. Default value: 0. AOI (0: OR combination of interrupt events; 1: AND combination of interrupt events) Latch interrupt request. Default value: 0. LIR (0: interrupt request not latched; 1: interrupt request latched) Enable Interrupt request on Z High event. Default value: 0. ZHIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value higher than preset threshold) Enable Interrupt request on Z Low event. Default value: 0. ZLIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value lower than preset threshold) Enable Interrupt request on Y High event. Default value: 0. YHIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value higher than preset threshold) Enable Interrupt request on Y Low event. Default value: 0. YLIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value lower than preset threshold) Enable Interrupt request on X High event. Default value: 0. XHIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value higher than preset threshold) Enable Interrupt request on X Low event. Default value: 0. XLIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value lower than preset threshold) Free-fall and inertial wake-up configuration register. 7.20 FF_WU_SRC (31h) Table 52. Register (31h) X IA ZH ZL YH YL XH XL 37/48

Register description LIS3LV02DL Table 53. Register description (31h) Interrupt Active. Default value: 0 IA (0: no interrupt has been generated; 1: one or more interrupt events have been generated) Z High. Default value: 0 ZH (0: no interrupt; 1: Z High event has occurred) Z Low. Default value: 0 ZL (0: no interrupt; 1: Z Low event has occurred) Y High. Default value: 0 YH (0: no interrupt; 1: Y High event has occurred) Y Low. Default value: 0 YL (0: no interrupt; 1: Y Low event has occurred) X High. Default value: 0 XH (0: no interrupt; 1: X High event has occurred) X Low. Default value: 0 XL (0: no interrupt; 1: X Low event has occurred) 7.21 FF_WU_ACK (32h) Dummy register. If LIR bit in FF_WU_CFG register is set to ‘1’, a reading at this address allows the FF_WU_SRC register refresh. Read data is not significant. 7.22 FF_WU_THS_L (34h) Table 54. Register (34h) THS7 THS6 THS5 THS4 THS3 THS2 THS1 THS0 Table 55. Register description (34h) THS7, THS0 Free-fall / Inertial Wake Up Acceleration Threshold LSB 7.23 FF_WU_THS_H (35h) Table 56. Register (35h) THS15 THS14 THS13 THS12 THS11 THS10 THS9 THS8 Table 57. Register description (35h) THS15, THS8 Free-fall / Inertial Wake Up Acceleration Threshold MSB 38/48

LIS3LV02DL Register description 7.24 FF_WU_DURATION (36h) Table 58. Register (36h) FWD7 FWD6 FWD5 FWD4 FWD3 FWD2 FWD1 FWD0 Table 59. Register description (36h) FWD7, FWD0 Minimum duration of the Free-fall/Wake-up event This register sets the minimum duration of the free-fall/wake-up event to be recognized. FF_WU_DURATION (Dec) Duration(s) = ------------------------------------------------------------------------ ODR 7.25 DD_CFG (38h) Table 60. Register (38h) IEND LIR ZHIE ZLIE YHIE YLIE XHIE XLIE Table 61. Register description (38h) Interrupt enable on Direction change. Default value: 0 IEND (0: disabled; 1: interrupt signal enabled) Latch Interrupt request into DD_SRC reg with the DD_SRC reg cleared by reading DD_ACK reg. Default value: 0. LIR (0: interrupt request not latched; 1: interrupt request latched) Enable interrupt generation on Z High event. Default value: 0 ZHIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value higher than preset threshold) Enable interrupt generation on Z Low event. Default value: 0 ZLIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value lower than preset threshold) Enable interrupt generation on Y High event. Default value: 0 YHIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value higher than preset threshold) Enable interrupt generation on Y Low event. Default value: 0 YLIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value lower than preset threshold) 39/48

Register description LIS3LV02DL Table 61. Register description (continued) (38h) Enable interrupt generation on X High event. Default value: 0 XHIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value higher than preset threshold) Enable interrupt generation on X Low event. Default value: 0 XLIE (0: disable interrupt request; 1: enable interrupt request on measured accel. value lower than preset threshold) Direction-detector configuration register. 7.26 DD_SRC (39h) Table 62. Register (39h) X IA ZH ZL YH YL XH XL Table 63. Register description (39h) Interrupt event from direction change. IA (0: no direction changes detected; 1: direction has changed from previous measurement) Z High. Default value: 0 ZH (0: Z below THSI threshold; 1: Z accel. exceeding THSE threshold along positive direction of acceleration axis) Z Low. Default value: 0 ZL (0: Z below THSI threshold; 1: Z accel. exceeding THSE threshold along negative direction of acceleration axis) Y High. Default value: 0 YH (0: Y below THSI threshold; 1: Y accel. exceeding THSE threshold along positive direction of acceleration axis) Y Low. Default value: 0 YL (0: Y below THSI threshold; 1: Y accel. exceeding THSE threshold along negative direction of acceleration axis) X High. Default value: 0 XH (0: X below THSI threshold; 1: X accel. exceeding THSE threshold along positive direction of acceleration axis) X Low. Default value: 0 XL (0: X below THSI threshold; 1: X accel. exceeding THSE threshold along negative direction of acceleration axis) Direction detector source register. 40/48

LIS3LV02DL Register description 7.27 DD_ACK (3Ah) Dummy register. If LIR bit in DD_CFG register is set to ‘1’, a reading at this address allows the DD_SRC register refresh. Read data is not significant. 7.28 DD_THSI_L (3Ch) Table 64. Register (3Ch) THSI7 THSI6 THSI5 THSI4 THSI3 THSI2 THSI1 THSI0 Table 65. Register description (3Ch) THSI7, THSI0 Direction detection Internal Threshold LSB 7.29 DD_THSI_H (3Dh) Table 66. Register (3Dh) THSI15 THSI14 THSI13 THSI12 THSI11 THSI10 THSI9 THSI8 Table 67. Register description (3Dh) THSI15, THSI8 Direction detection Internal Threshold MSB 7.30 DD_THSE_L (3Eh) Table 68. Register (3Eh) THSE7 THSE6 THSE5 THSE4 THSE3 THSE2 THSE1 THSE0 Table 69. Register description (3Eh) THSE7, THSE0 Direction detection External Threshold LSB 7.31 DD_THSE_H (3Fh) Table 70. Register (3Fh) THSE15 THSE14 THSE13 THSE12 THSE11 THSE10 THSE9 THSE8 Table 71. Register description (3Fh) THSE15, THSE8 Direction detection External Threshold MSB 41/48

Typical performance characteristics LIS3LV02DL 8 Typical performance characteristics 8.1 Mechanical characteristics at 25°C Figure 12. X-axis zero-g level at 3.3 V Figure 13. X-axis sensitivity at 3.3 V 20 25 18 16 20 14 %] %] Percent of parts [11802 Percent of parts [1105 6 4 5 2 0 0 −60 −40 −20 0 20 40 60 940 960 980 1000 1020 1040 1060 1080 1100 1120 Zero−g Level Offset [mg] Sensitivity [LSB/g] Figure 14. Y-axis zero-g level at 3.3 V Figure 15. Y-axis sensitivity at 3.3 V 25 25 20 20 %] %] Percent of parts [1105 Percent of parts [1105 5 5 0 0 −60 −40 −20 0 20 40 60 940 960 980 1000 1020 1040 1060 1080 1100 1120 Zero−g Level Offset [mg] Sensitivity [LSB/g] 42/48

LIS3LV02DL Typical performance characteristics Figure 16. Z-axis zero-g level at 3.3 V Figure 17. Z-axis Sensitivity at 3.3 V 25 30 25 20 %] %]20 Percent of parts [1105 Percent of parts [1105 5 5 0 0 −60 −40 −20 0 20 40 60 940 960 980 1000 1020 1040 1060 1080 1100 1120 Zero−g Level Offset [mg] Sensitivity [LSB/g] 8.2 Mechanical characteristics derived from measurement in the -40°C to +85°C temperature range Figure 18. X-axis zero-g level change vs. Figure 19. X-axis sensitivity change vs. temperature at 3.3 V temperature at 3.3 V 20 25 18 16 20 14 %] %] Percent of parts [11802 Percent of parts [1105 6 4 5 2 0 0 −1.5 −1 −0.5 0 0.5 1 1.5 −0.05 −0.045 −0.04 −0.035 −0.03 −0.025 −0.02 −0.015 −0.01 −0.005 0 Zero−g Level drift [mg/oC] Sensitivity drift [%/oC] 43/48

Typical performance characteristics LIS3LV02DL Figure 20. Y-axis zero-g level change vs. Figure 21. Y-axis sensitivity change vs. temperature at 3.3 V temperature at 3.3 V 40 25 35 20 30 Percent of parts [%]122505 Percent of parts [%]1105 10 5 5 0 0 −1 −0.8 −0.6 −0.4 −0.2 0 0.2 0.4 0.6 0.8 1 −0.015 −0.01 −0.005 0 0.005 0.01 0.015 0.02 Zero−g Level drift [mg/oC] Sensitivity drift [%/oC] Figure 22. Z-axis zero-g level change vs. Figure 23. Z-axis sensitivity change vs. temperature at 3.3 V temperature at 3.3 V 25 30 25 20 %] %]20 Percent of parts [1105 Percent of parts [1105 5 5 0 0 −2.5 −2 −1.5 −1 −0.5 0 0.5 1 1.5 2 2.5 −0.05 −0.04 −0.03 −0.02 −0.01 0 0.01 0.02 Zero−g Level drift [mg/oC] Sensitivity drift [%/oC] 8.3 Electro-mechanical characteristics at 25°C Figure 24. X and Y axis zero-g level as Figure 25. Z axis zero-g level as function of function of supply voltage supply voltage 60 100 80 40 60 20 Zero−g level [mg] 0 Zero−g level [mg] 2400 −20 0 −40 −20 −60 −40 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 2 2.2 2.4 2.6 2.8 3 3.2 3.4 3.6 Supply Voltage [V] Supply Voltage [V] 44/48

LIS3LV02DL Typical performance characteristics Figure 26. Current consumption in Power- Figure 27. Current consumption in operational Down mode (Vdd=3.3 V) mode (Vdd=3.3 V) 35 16 30 14 12 25 Percent of parts [%]1250 Percent of parts [%]1680 10 4 5 2 0 0 −5 −2.5 0 2.5 5 550 600 650 700 750 Current consumption [uA] Current consumption [uA] 45/48

Package information LIS3LV02DL 9 Package information In order to meet environmental requirements, ST offers these devices in ECOPACK® packages. These packages have a lead-free second level interconnect. The category of second Level Interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK® is an ST trademark. ECOPACK® specifications are available at: www.st.com. Figure 28. LGA-16 mechanical data and package dimensions mm inch DIM. OUTLINE AND MIN. TYP. MAX. MIN. TYP. MAX. MECHANICAL DATA A1 0.92 1 0.0394 A2 0.7 0.0276 A3 0.180 0.220 0.260 0.0071 0.0087 0.0102 D1 4.250 4.400 4.550 0.1673 0.1732 0.1791 E1 7.350 7.500 7.650 0.2894 0.2953 0.3012 e 1.0 0.0394 d 0.3 0.0118 L1 5.000 0.1969 N 2.5 0.0984 N1 1.2 0.0472 P1 0.965 0.975 0.985 0.0380 0.0384 0.0388 P2 0.64 0.65 0.66 0.0252 0.0256 0.0260 T1 0.75 0.8 0.85 0.0295 0.0315 0.0335 T2 0.45 0.5 0.55 0.0177 0.0197 0.0217 R 1.200 1.600 0.0472 0.0630 h 0.150 0.0059 k 0.050 0.0020 LGA16 (4.4x7.5x1mm) i 0.100 0.0039 Land Grid Array Package s 0.100 0.0039 E E1 A3 N A e i C d k (4 x) D R N1 1 2 3 4 5 6 D 16 7 D1 e 15 8 k E T1 14 13 12 11 10 9 A2 s B E k D A1 Detail A T2 seating plane i P2 h CAB L1 Detail A Metal Pad P1 i CAB h CAB i CAB Solder mask opening 7863679 B 46/48

LIS3LV02DL Revision history 10 Revision history Table 72. Document revision history Date Revision Changes 15-Feb-2006 1 Initial release. Added two new sections: Section2.3: Communication interface characteristics and Section8: 15-Jan-2008 2 Typical performance characteristics. Content reworked to improve readability 47/48

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